Total reflection X-ray fluorescence analysis and related methods /

Total reflection X-ray fluorescence analysis and related methods /

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Bibliographic Details
Author / Creator:	Klockenkämper, Reinhold, 1937- author.
Edition:	Second edition.
Imprint:	Hoboken, New Jersey : Wiley, [2015] ©2015
Description:	xxvi, 519 pages, 8 pages of plates : illustrations (some color) ; 25 cm.
Language:	English
Series:	Chemical analysis ; volume 181 Chemical analysis ; v. 181.
Subject:	Fluorescence spectroscopy. X-ray spectroscopy. Reflectance spectroscopy. Fluorescence spectroscopy. X-ray spectroscopy.
Format:	Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/10156744

Hidden Bibliographic Details
Other authors / contributors:	Bohlen, Alex von, 1954- author.
ISBN:	9781118460276 1118460278
Notes:	Previous edition: 1997. Includes bibliographical references and index.
Summary:	Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis Pinpoints new applications of TRXF in different fields of biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry Updated and detailed sections on sample preparation taking into account nano- and picoliter techniques Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation Includes some 700 references for further study -- Provided by publisher.

Mansueto

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Call Number:	QD131.C5 v.181
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