Light scattering from microstructures : lectures of the Summer School of Laredo, University of Cantabria, held at Laredo, Spain, Sept. 11-13, 1998 /

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Bibliographic Details
Imprint:Berlin ; New York : Springer, ©2000.
Description:1 online resource (xii, 300 pages) : illustrations.
Language:English
Series:Lecture notes in physics, 1616-6361 ; 534
Lecture notes in physics ; 534.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11064686
Hidden Bibliographic Details
Other authors / contributors:Moreno, Fernando, 1957-
González, Francisco, 1957-
Universidad de Cantabria.
ISBN:9783540466147
3540466142
354066937X
9783540669371
Notes:Includes bibliographical references (page 300).
Print version record.
Summary:With a tutorial approach, this book covers the most impor- tant aspects of the scattering of electromagnetic radiation from structures (isolated or on a substrate) whose size is comparable to the incident wavelength. Special emphasis is placed on the electromagnetic problem of microstructures lo- cated close to an interface by reviewing the most important numerical methods for calculating the scattered field. The polarization propagation and the statistics of scattered in- tensity in microstructured targets are also presented from a didactic point of view. The final part of the book is dedi- cated to the most significant applications in both basic and applied research: surface enhanced Raman scattering, monito- ring and detection of surface contamination by particles, optical communications, particle sizing and others.
Other form:Print version: Light scattering from microstructures. Berlin ; New York : Springer, ©2000 354066937X
Description
Summary:The classical phenomenon of light scattering is one of the most studied t- ics in light-matter interaction and, even today, involves some controversial issues. A present focus of interest for many researchers is the possibility of obtaining information about microstructures, for example surface roughness, and the size, shape and optical properties of particles by means of a n- invasive technique such as the illumination of these objects with light. One of their main tasks is to extract the relevant information from a detailed study of the scattered radiation. This includes: measurement of the light intensity in di erent directions, analysis of its polarization, determination of its stat- tics,etc. Contributionstoresolvingthisproblemareimportantnotonlyfrom the point of view of increasing basic knowledge but also in their applications to several elds of industry and technology. Consider, for example, the pos- bility of distinguishing between di erent types of atmospheric contaminants, biological contaminants in our blood, the detection of microdefects in the manufacturing of semiconductors, magnetic discs and optical components, or the development of biological sensors. During the period September 11-13, 1998, we brought together a group of international experts on light scattering at the Summer School of Laredo at the University of Cantabria. In a series of one-hour lectures, they discussed currentaspectsoflightscatteringfrommicrostructureswithspecialemphasis on recent applications. The present book condenses those lectures into ve parts.
Physical Description:1 online resource (xii, 300 pages) : illustrations.
Bibliography:Includes bibliographical references (page 300).
ISBN:9783540466147
3540466142
354066937X
9783540669371
ISSN:1616-6361
;