Modeling and analysis of transient processes in open resonant structures : new methods and techniques /

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Bibliographic Details
Author / Creator:Sirenko, Yuriy K.
Imprint:New York : Springer, ©2007.
Description:1 online resource (xiv, 353 pages) : illustrations.
Language:English
Series:Springer series in optical sciences ; v. 122
Springer series in optical sciences ; v. 122.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11066138
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Other authors / contributors:Ström, Staffan.
Yashina, Nataliya P.
ISBN:9780387325774
0387325778
0387308784
9780387308784
Notes:Includes bibliographical references (pages 334-345) and index.
Restrictions unspecified
Electronic reproduction. [S.l.] : HathiTrust Digital Library, 2010.
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212
digitized 2010 HathiTrust Digital Library committed to preserve
Print version record.
Summary:"The principal goal of the book is to describe new accurate and robust algorithms for open resonant structures with substantially increased efficiency. These algorithms allow the extraction of complete information with estimated accuracy concerning the scattering of transient electromagnetic waves by complex objects. The determination and visualization of the electromagnetic fields, developed for realistic models, simplify and significantly speed up the solution to a wide class of fundamental and applied problems of electromagnetic field theory." "The book presents a systematic approach to the study of electromagnetic waves scattering that can be introduced in undergraduate/postgraduate education in theoretical and applied radiophysics and different advanced engineering courses on antenna and wave-guide technology. On a broader level, the book will be of interest to scientists in optics, computational physics, and applied mathematics."--Jacket.
Other form:Print version: Sirenko, Yuriy K. Modeling and analysis of transient processes in open resonant structures. New York : Springer, ©2007 0387308784 9780387325774
Standard no.:10.1007/0-387-32577-8