Hidden Bibliographic Details
| ISBN: | 9783662148242
3662148242
9783662148266
3662148269
3540625682
9783540625681
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| Notes: | Includes bibliographical references (pages 495-569) and index.
Print version record.
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| Summary: | Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fourth edition includes discussion of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.
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| Other form: | Print version: Reimer, Ludwig, 1928- Transmission electron microscopy. 4th ed. Berlin ; New York : Springer, ©1997
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| Standard no.: | 10.1007/978-3-662-14824-2
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