Transmission electron microscopy : physics of image formation and microanalysis /
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Author / Creator: | Reimer, Ludwig, 1928- |
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Edition: | 4th ed. |
Imprint: | Berlin ; New York : Springer, ©1997. |
Description: | 1 online resource (xvi, 584 pages) : illustrations. |
Language: | English |
Series: | Springer series in optical sciences, 0342-4111 ; v. 36 Springer series in optical sciences ; v. 36. |
Subject: | |
Format: | E-Resource Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/11074367 |
Table of Contents:
- 1. Introduction
- 2. Particle Optics of Electrons
- 3. Wave Optics of Electrons
- 4. Elements of a Transmission Electron Microscope
- 5. Electron-Specimen Interactions
- 6. Scattering and Phase Contrast for Amorphous Specimens
- 7. Theory of Electron Diffraction
- 8. Electron Diffraction Modes and Applications
- 9. Imaging of Crystalline Specimens and Their Defects
- 10. Elemental Analysis by X-Ray and Electron Energy-Loss Spectroscopy
- 11. Specimen Damage by Electron Irradiation
- References.