Laboratory micro-x-ray fluorescence spectroscopy : instrumentation and applications /
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| Author / Creator: | Haschke, Michael, 1948- author. |
|---|---|
| Imprint: | Cham : Springer, 2014. |
| Description: | 1 online resource. |
| Language: | English |
| Series: | Springer series in surface sciences ; volume 55 Springer series in surface sciences ; v. 55. |
| Subject: | |
| Format: | E-Resource Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/11084965 |
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| 100 | 1 | |a Haschke, Michael, |d 1948- |e author. |0 http://id.loc.gov/authorities/names/nb2014014251 |1 http://viaf.org/viaf/309833869 | |
| 245 | 1 | 0 | |a Laboratory micro-x-ray fluorescence spectroscopy : |b instrumentation and applications / |c Michael Haschke. |
| 264 | 1 | |a Cham : |b Springer, |c 2014. | |
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| 490 | 1 | |a Springer series in surface sciences ; |v volume 55 | |
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| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a XRF-Basics -- Main Components of X-Ray Spectrometers -- Special Requirements for µ-XRF -- Quantification -- Sample Preparation -- Relations to Other Analytical Methods -- Applications. | |
| 520 | |a Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions. | ||
| 650 | 0 | |a X-ray spectroscopy. |0 http://id.loc.gov/authorities/subjects/sh85148744 | |
| 650 | 0 | |a X-ray microanalysis. |0 http://id.loc.gov/authorities/subjects/sh85148737 | |
| 650 | 0 | |a X-ray spectroscopy |x Instruments. | |
| 650 | 0 | |a X-ray microanalysis |x Instruments. | |
| 650 | 0 | |a Inhomogeneous materials |x Analysis. | |
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| 830 | 0 | |a Springer series in surface sciences ; |v v. 55. | |
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