Scanning electron microscopy : physics of image formation and microanalysis /
Saved in:
| Author / Creator: | Reimer, Ludwig, 1928- |
|---|---|
| Edition: | Second completely revised and updated edition. |
| Imprint: | Berlin ; New York : Springer, [1998] ©1998 |
| Description: | 1 online resource (xiv, 527 pages) : illustrations. |
| Language: | English |
| Series: | Springer series in optical sciences ; volume 45 Springer series in optical sciences ; v. 45. |
| Subject: | |
| Format: | E-Resource Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/11086185 |
| Summary: | Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. |
|---|---|
| Physical Description: | 1 online resource (xiv, 527 pages) : illustrations. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9783540389675 3540389679 9783642083723 3642083722 3540639764 9783540639763 |