Scanning electron microscopy : physics of image formation and microanalysis /
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| Author / Creator: | Reimer, Ludwig, 1928- |
|---|---|
| Edition: | Second completely revised and updated edition. |
| Imprint: | Berlin ; New York : Springer, [1998] ©1998 |
| Description: | 1 online resource (xiv, 527 pages) : illustrations. |
| Language: | English |
| Series: | Springer series in optical sciences ; volume 45 Springer series in optical sciences ; v. 45. |
| Subject: | |
| Format: | E-Resource Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/11086185 |
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| 100 | 1 | |a Reimer, Ludwig, |d 1928- |0 http://id.loc.gov/authorities/names/n83160359 |1 http://viaf.org/viaf/65163372 | |
| 245 | 1 | 0 | |a Scanning electron microscopy : |b physics of image formation and microanalysis / |c Ludwig Reimer. |
| 250 | |a Second completely revised and updated edition. | ||
| 264 | 1 | |a Berlin ; |a New York : |b Springer, |c [1998] | |
| 264 | 4 | |c ©1998 | |
| 300 | |a 1 online resource (xiv, 527 pages) : |b illustrations. | ||
| 336 | |a text |b txt |2 rdacontent |0 http://id.loc.gov/vocabulary/contentTypes/txt | ||
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| 490 | 1 | |a Springer series in optical sciences ; |v volume 45 | |
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a 1. Introduction -- 2. Electron optics of a scanning electron microscope -- 3. Electron scattering and diffusion -- 4. Emission of backscattered and secondary electrons -- 5. Electron detectors and spectrometers -- 6. Image contrast and signal processing -- 7. Electron-beam-induced current and cathodoluminescence -- 8. Special techniques in SEM -- 9. Crystal structure analysis by diffraction -- 10. Elemental analysis and imaging with X-rays. | |
| 520 | |a Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. | ||
| 588 | 0 | |a Print version record. | |
| 650 | 0 | |a Scanning electron microscopy. |0 http://id.loc.gov/authorities/subjects/sh91002757 | |
| 650 | 7 | |a Optique électronique. |2 eclas | |
| 650 | 7 | |a Instruments d'optique. |2 eclas | |
| 650 | 7 | |a Scanning electron microscopy. |2 fast |0 (OCoLC)fst01106480 | |
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| 650 | 1 | 7 | |a Verstrooiing. |2 gtt |
| 650 | 1 | 7 | |a Kristalstructuur. |2 gtt |
| 650 | 0 | 7 | |a Rasterelektronenmikroskopie. |2 swd |
| 655 | 4 | |a Electronic books. | |
| 776 | 0 | 8 | |i Print version: |a Reimer, Ludwig, 1928- |t Scanning electron microscopy. |b Second completely revised and updated edition |z 3540639764 |w (DLC) 98026178 |w (OCoLC)39281893 |
| 830 | 0 | |a Springer series in optical sciences ; |v v. 45. | |
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