Electron dynamics by inelastic X-ray scattering /
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Author / Creator: | Schülke, Winfried. |
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Imprint: | Oxford ; New York : Oxford University Press, 2007. |
Description: | 1 online resource (xiii, 591 pages) : illustrations |
Language: | English |
Series: | Oxford series on synchrotron radiation ; 7 Oxford series on synchrotron radiation ; 7. |
Subject: | |
Format: | E-Resource Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/11158233 |
Summary: | Knowledge of the dynamics of many-electron systems is of fundamental importance to all disciplines of condensed matter physics. A very effective access to electron dynamics is offered by inelastic X-ray scattering (IXS) spectroscopy. The double differential scattering cross section for IXS is directly related to the time-dependent two-particle density correlation function, and, for large momentum and energy transfer (Compton limit) to the electron momentum distribution. Moreover, resonant inelastic X-ray scattering (RIXS) enables the study of electron dynamics via electronic excitations in a very selective manner (e.g. selectively spin, crystal momentum, or symmetry), so that other methods are efficaciously complemented. The progress of IXS spectroscopy is intimately related to the growing range of applications of synchrotron radiation. The aim of the book is to provide the growing community of researchers with accounts of experimental methods, instrumentation, and data analysis of IXS, with representative examples of successful applications, and with the theoretical framework for interpretations of the measurements. |
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Physical Description: | 1 online resource (xiii, 591 pages) : illustrations |
Bibliography: | Includes bibliographical references and index. |
ISBN: | 9780191523281 0191523283 9780198510178 0198510179 1281160067 9781281160065 9786611160067 661116006X 1435620720 9781435620728 |