Electron dynamics by inelastic X-ray scattering /

Electron dynamics by inelastic X-ray scattering /

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Bibliographic Details
Author / Creator:	Schülke, Winfried.
Imprint:	Oxford ; New York : Oxford University Press, 2007.
Description:	1 online resource (xiii, 591 pages) : illustrations
Language:	English
Series:	Oxford series on synchrotron radiation ; 7 Oxford series on synchrotron radiation ; 7.
Subject:	X-rays -- Scattering. Electrons -- Inelastic scattering. Electrons -- Inelastic scattering. X-rays -- Scattering. Electronic books.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/11158233

Hidden Bibliographic Details
ISBN:	9780191523281 0191523283 9780198510178 0198510179 1281160067 9781281160065 9786611160067 661116006X 1435620720 9781435620728
Notes:	Includes bibliographical references and index. English. Print version record.
Summary:	The book offers the first comprehensive review of experimental methods, theory, and successful applications of synchrotron radiation based inelastic X-ray scattering (IXS) spectroscopy, which enables the investigation of electron dynamics in condensed matter (correlated motion and excitation). - ;Knowledge of the dynamics of many-electron systems is of fundamental importance to all disciplines of condensed matter physics. A very effective access to electron dynamics is offered by inelastic X-ray scattering (IXS) spectroscopy. The double differential scattering cross section for IXS is directly.
Other form:	Print version: Schülke, Winfried. Electron dynamics by inelastic X-ray scattering. Oxford ; New York : Oxford University Press, 2007 9780198510178 0198510179

Table of Contents:

Contents; List of important symbols; 1 Introductory survey; 2 Characteristic valence electron excitations; 3 Core-electron excitation (X-ray Raman scattering (XRS)); 4 The Compton scattering regime; 5 Resonant inelastic X-ray scattering (RIXS); 6 Theoretical foundation; Index.