Crystallography : research, technology and applications /

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Bibliographic Details
Imprint:New York : Nova/Nova Science Publishers, Inc., [2012]
Description:1 online resource.
Language:English
Series:Materials science and technologies
Physics research and technology
Physics research and technology.
Materials science and technologies series.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11180412
Hidden Bibliographic Details
Other authors / contributors:Hokkaido, Misao, editor.
Nagano, Eiko, editor.
ISBN:9781620816318
1620816318
9781620815748
1620815745
Notes:Includes bibliographical references and index.
English.
Description based on print version record; title from PDF title page, viewed (07/14/2020).
Other form:Print version: Crystallography New York : Nova/Nova Science Publishers, Inc., [2012] 9781620815748 (hardcover)
Table of Contents:
  • CRYSTALLOGRAPHY: RESEARCH, TECHNOLOGY AND APPLICATIONS; CRYSTALLOGRAPHY: RESEARCH, TECHNOLOGY AND APPLICATIONS; LIBRARY OF CONGRESS CATALOGING-IN-PUBLICATION DATA; CONTENTS; PREFACE; Chapter 1: PHASING METHODS IN CRYSTALLOGRAPHY: THEORY AND APPLICATIONS; ABSTRACT; INTRODUCTION; THE PHASE PROBLEM; AB INITIO PHASING; 1. Direct Methods; 2. Patterson Methods; 3. Phase Refinement; 4. New Methods: Dual-space Approaches; NOT-AB INITIO PHASING; 1. Global Optimization Search; 2. Molecular Replacement; REFERENCES; Chapter 2: IN SITU PROTEIN CRYSTAL DIFFRACTION SCREENING; ABSTRACT; INTRODUCTION.
  • ROOM TEMPERATURE VS CRYO-COOLINGDIFFRACTION STRENGTH METRICS; SOURCES OF BACKGROUND AND THEIR EFFECT ON DATA QUALITY; CRYSTAL MORPHOLOGY AND SIZE; CRYSTALLISATION PLATES FOR IN SITU DIFFRACTION; CURRENTLY AVAILABLE IN SITU SCREENING POSSIBILITIES; REFERENCES; Chapter 3: STRUCTURES AND PROPERTIES OF 3D-4F AND 3D CHIRAL SCHIFF BASE COMPLEXES; ABSTRACT; INTRODUCTION; EXPERIMENTAL SECTION; Materials; Preparations; Physical Measurements; X-Ray Crystallography; RESULTS AND DISCUSSION; Crystal Structures; Magnetic Properties; XAS Spectra; Diffuse Reflectance and Solid-State CD Spectra; CONCLUSION.
  • SUPPLEMENTARY DATACrystallographic Data; ACKNOWLEDGMENTS; REFERENCES; Chapter 4: H/D ISOTOPE EFFECT ON THERMALLY-ACCESSIBLE STRUCTURAL CHANGES OF CYANIDE-BRIDGED CU(II)-CO(III) BIMETALLIC ASSEMBLIES; ABSTRACT; INTRODUCTION; EXPERIMENTAL SECTION; Materials; Preparations; Physical Measurements; X-Ray Crystallography; Computations; Diffuse Reflectance; RESULTS AND DISCUSSION; Diffuse Reflectance; Crystal Structures; IR Spectroscopy; CONCLUSION; SUPPLEMENTARY DATA; Crystallographic Data; ACKNOWLEDGMENT; REFERENCES; Chapter 5: CRYSTAL DEHYDRATION TECHNIQUE; ABSTRACT; INTRODUCTION.
  • CRYSTAL DEHYDRATION-A HISTORICAL PROSPECTIVECRYSTAL DEHYDRATION TECHNIQUES; Dehydration by Changing Relative Humidity; Dehydration by Using a Dehydrating Agent; DEHYDRATION OF SACCHAROMYCES CEREVISIAE RIBONUCLEOTIDE REDUCTASE (SCRR) CRYSTALS; Cubic Crystal Form; Hexameric Crystal Form; CONCLUSION; ACKNOWLEDGMENTS; REFERENCES; Chapter 6: CASE STUDIES ON CRYSTAL STRUCTURE DETERMINATION INVOLVING H ATOMS; ABSTRACT; INTRODUCTION; EXPERIMENTAL SECTION; Preparations; X-Ray Crystallography; RESULTS AND DISCUSSION; Case 1. C14H12N2O3; Case 2. C26H28Cu2N6O10; Case 3. C36H80Co2Cu3N24O4 (at 100 K)
  • Case 4. C36H80Co2Cu3N24O4(296 K)CONCLUSION; REFERENCES; Chapter 7: MATRIX VISCOSITY-DEPENDENCE OF CD SPECTRA OF A CHIRAL SCHIFF BASE MANGANESE(III) COMPLEX; ABSTRACT; INTRODUCTION; EXPERIMENTAL SECTION; Materials; Preparations; Physical Measurements; X-ray Crystallography; RESULTS AND DISCUSSION; Crystal Structures; Magnetic Properties; CD Spectra; CONCLUSION; ACKNOWLEDGMENT; SUPPLEMENTARY DATA; Crystallographic Data; REFERENCES.