Hard x-ray photoelectron spectroscopy (HAXPES) /

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Bibliographic Details
Imprint:Cham : Springer, 2016.
Description:1 online resource (xii, 571 pages) : illustrations (some color)
Language:English
Series:Springer series in surface sciences, 0931-5195 ; 59
Springer series in surface sciences ; 59.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11251696
Hidden Bibliographic Details
Other authors / contributors:Woicik, Joseph C., editor.
ISBN:9783319240435
3319240439
3319240412
9783319240411
Digital file characteristics:text file
PDF
Notes:Includes index.
Includes bibliographical references and index.
English.
Online resource; title from PDF title page (SpringerLink, viewed January 7, 2016).
Summary:This book provides the first complete and up-to-date summary of the state of the art in HAXPES and motivates readers to harness its powerful capabilities in their own research. The chapters are written by experts. They include historical work, modern instrumentation, theory and applications. This book spans from physics to chemistry and materials science and engineering. In consideration of the rapid development of the technique, several chapters include highlights illustrating future opportunities as well.
Other form:Print version: 3319240412 9783319240411
Standard no.:10.1007/978-3-319-24043-5
Description
Summary:This book provides the first complete and up-to-date summary of the state of the art in HAXPES and motivates readers to harness its powerful capabilities in their own research. The chapters are written by experts. They include historical work, modern instrumentation, theory and applications. This book spans from physics to chemistry and materials science and engineering. In consideration of the rapid development of the technique, several chapters include highlights illustrating future opportunities as well.
Item Description:Includes index.
Physical Description:1 online resource (xii, 571 pages) : illustrations (some color)
Bibliography:Includes bibliographical references and index.
ISBN:9783319240435
3319240439
3319240412
9783319240411
ISSN:0931-5195
;