Dual process theory 2.0 /

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Bibliographic Details
Imprint:Abingdon, Oxon ; New York, NY : Routledge, an imprint of the Taylor & Francis Group, 2018.
Description:viii, 159 pages ; 25 cm.
Language:English
Series:Current issues in thinking and reasoning
Current issues in thinking & reasoning.
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11464063
Hidden Bibliographic Details
Other authors / contributors:De Neys, Wim, editor.
ISBN:9781138700628
1138700622
9781138700642
1138700649
9781315204550
Notes:Includes bibliographical references and index.
Other form:Online version: Dual process theory 2.0 1 Edition. New York : Routledge, 2018 9781315204550
Table of Contents:
  • Dual process theory 2.0 : an introduction / Wim De Neys
  • A perspective on the theoretical foundation of dual process models / Gordon Pennycook
  • The parallel processing model of belief bias : review and extensions / Dries Trippas & Simon Handley
  • Bias, conflict, and fast logic : towards a hybrid dual process future? / Wim De Neys
  • Comparing dual process theories : evidence from event-related potentials / Adrian Banks
  • The fuzzy-trace dual process model / Valerie Reyna, Shahin Rahimi-Golkhandan, David Garavito, & Rebecca Helm
  • Conflict and dual process theory : the case of belief bias / Linden Ball, Valerie Thompson, & Edward Stupple
  • Logical intuitions and other conundra for dual process theories / Valerie Thompson & Ian Newman
  • Dual process theory : perspectives and problems / Jonathan Evans.