Accurate and robust spectral testing with relaxed instrumentation requirements /

Accurate and robust spectral testing with relaxed instrumentation requirements /

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Bibliographic Details
Author / Creator:Zhuang, Yuming, author.
Imprint:Cham, Switzerland : Springer, 2018.
Description:1 online resource
Language:English
Subject:
Measuring instruments -- Testing.
Signal theory (Telecommunication)
Measuring instruments -- Testing.
Signal theory (Telecommunication)
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11736634
Hidden Bibliographic Details
Other authors / contributors:Chen, Degang, author.
ISBN:9783319777184
3319777181
9783319777191
331977719X
9783030085209
3030085201
9783319777177
3319777173
Digital file characteristics:text file
PDF
Notes:Includes bibliographical references.
Online resource; title from PDF title page (EBSCO, viewed April 10, 2018).
Summary:This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost.
Other form:Print version: Zhuang, Yuming. Accurate and robust spectral testing with relaxed instrumentation requirements. Cham, Switzerland : Springer, 2018 3319777173 9783319777177
Standard no.:10.1007/978-3-319-77718-4

MARC

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100 1 |a Zhuang, Yuming,  |e author. 
245 1 0 |a Accurate and robust spectral testing with relaxed instrumentation requirements /  |c Yuming Zhuang, Degang Chen. 
264 1 |a Cham, Switzerland :  |b Springer,  |c 2018. 
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520 |a This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost. 
588 0 |a Online resource; title from PDF title page (EBSCO, viewed April 10, 2018). 
505 0 |a Intro; Abstract; Acknowledgments; Contents; Chapter 1: Introduction; 1.1 Background on Spectral Testing; 1.2 IEEE Standards and Conventional Spectral Testing; 1.3 Conventional Spectral Testing Challenges; References; Chapter 2: Algorithms for Accurate Spectral Analysis in the Presence of Arbitrary Non-coherency and Large Distortion; 2.1 Introduction; 2.2 Problem Statement; 2.3 Algorithms for Resolving Non-coherency with Large Distortion; 2.3.1 Algorithm 1; 2.3.2 Algorithm 2; 2.3.3 Algorithm 3; 2.3.4 Algorithm Analysis; 2.4 Simulation Results; 2.4.1 Functionality; 2.4.2 Robustness. 
505 8 |a 2.5 Measurement Results2.6 Conclusion; References; Chapter 3: Accurate Spectral Testing with Arbitrary Non-coherency in Sampling and Simultaneous Drifts in Amplitude and Frequen ... ; 3.1 Introduction; 3.2 Standard Test and Drift Issue; 3.2.1 Standard Test; 3.2.2 Challenges of Amplitude/Frequency Drift and Non-coherent Sampling; 3.3 Proposed Algorithm; 3.3.1 Drift Segmentation; 3.3.2 Drift Modeling; 3.3.3 Signal Segmentation and Drift Estimation; 3.3.4 Error Analysis; 3.3.5 Segment Length Selection; 3.4 Simulation Results; 3.4.1 Functionality; 3.4.2 Robustness: Segment Length. 
505 8 |a 3.4.3 Robustness: Number of Periods3.4.4 Robustness: Non-coherency; 3.5 Measurement Results; 3.6 Conclusion; References; Chapter 4: High-Purity Sine Wave Generation Using Nonlinear DAC with Pre-distortion Based on Low-Cost Accurate DAC-ADC Co-test ... ; 4.1 Introduction; 4.2 Challenges of the Standard Test; 4.3 Proposed Method; 4.3.1 ADC Nonlinearity Estimation; 4.3.2 DAC Nonlinearity Estimation; 4.3.3 Pre-distortion; 4.4 Simulation Results; 4.4.1 Functionality; 4.4.2 Robustness; 4.5 Measurement Results; 4.6 Conclusion; References. 
505 8 |a Chapter 5: Low-Cost Ultrapure Sine Wave Generation with Self-Calibration5.1 Introduction; 5.2 Proposed Method; 5.2.1 Signal Derivation; 5.2.2 Fundamental Amplitude Match; 5.2.3 Fundamental Phase Match; 5.2.4 Non-coherent Fundamental Identification; 5.2.5 DAC Nonlinearity Estimation; 5.2.6 Cal DAC Calibration; 5.2.7 Ultrapure Signal Capturing; 5.2.8 Iterations and Convergence; 5.3 Simulation Results; 5.4 Measurement Results; 5.5 Conclusion; References; Chapter 6: Accurate Spectral Testing with Non-coherent Sampling for Multi-tone Test; 6.1 Introduction. 
505 8 |a 6.2 Non-coherent Sampling for Multi-tone Test6.3 Proposed Method; 6.3.1 Fundamentals Initial Estimation; 6.3.2 More Accurate Estimation of the Fundamentals; 6.3.3 Coherent Spectrum Construction; 6.4 Simulation Results; 6.4.1 Functionality; 6.4.2 Robustness; 6.5 Measurement Results; 6.6 Conclusion; References; Chapter 7: Accurate Spectral Testing with Impure Test Stimulus for Multi-tone Test; 7.1 Introduction; 7.2 Impure Test Stimulus for Multi-tone Test; 7.3 Proposed Method; 7.3.1 Impure Stimulus; 7.3.2 Two Filters; 7.3.3 Proposed Method; 7.3.4 Discussion; 7.4 Simulation Results. 
650 0 |a Measuring instruments  |x Testing.  |0 http://id.loc.gov/authorities/subjects/sh85082708 
650 0 |a Signal theory (Telecommunication)  |0 http://id.loc.gov/authorities/subjects/sh85122401 
650 7 |a TECHNOLOGY & ENGINEERING  |x Mechanical.  |2 bisacsh 
650 7 |a Circuits & components.  |2 bicssc 
650 7 |a Electronics engineering.  |2 bicssc 
650 7 |a Measuring instruments  |x Testing.  |2 fast  |0 (OCoLC)fst01013197 
650 7 |a Signal theory (Telecommunication)  |2 fast  |0 (OCoLC)fst01118306 
655 4 |a Electronic books. 
700 1 |a Chen, Degang,  |e author. 
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