Test fairness in the new generation of large-scale assessment /

Test fairness in the new generation of large-scale assessment /

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Bibliographic Details
Imprint:	Charlotte, NC : Information Age Publishing, Inc., [2017]
Description:	1 online resource
Language:	English
Series:	The MARCES book series
Subject:	Test bias. Examinations -- Validity. Examinations -- Validity. Test bias.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/12350722

Hidden Bibliographic Details
Other authors / contributors:	Jiao, Hong, 1968- editor. Lissitz, Robert W., editor.
ISBN:	9781681238951 1681238950 9781681238937 9781681238944
Notes:	Includes bibliographical references. Print version record and CIP data provided by publisher; resource not viewed.
Other form:	Print version: Test fairness in the new generation of large-scale assessment. Charlotte, NC : Information Age Publishing, Inc., [2017] 9781681238937

Description
Physical Description:	1 online resource
Bibliography:	Includes bibliographical references.
ISBN:	9781681238951 1681238950 9781681238937 9781681238944