Test fairness in the new generation of large-scale assessment /

Test fairness in the new generation of large-scale assessment /

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Bibliographic Details
Imprint:Charlotte, NC : Information Age Publishing, Inc., [2017]
Description:1 online resource
Language:English
Series:The MARCES book series
Subject:
Test bias.
Examinations -- Validity.
Examinations -- Validity.
Test bias.
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/12350722
Hidden Bibliographic Details
Other authors / contributors:Jiao, Hong, 1968- editor.
Lissitz, Robert W., editor.
ISBN:9781681238951
1681238950
9781681238937
9781681238944
Notes:Includes bibliographical references.
Print version record and CIP data provided by publisher; resource not viewed.
Other form:Print version: Test fairness in the new generation of large-scale assessment. Charlotte, NC : Information Age Publishing, Inc., [2017] 9781681238937

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