Lattice defects in semiconductors.

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Bibliographic Details
Meeting name:International Symposium on Lattice Defects in Semiconductors (1966 : Tokyo, Japan)
Imprint:Tokyo, University of Tokyo Press; University Park, Pennsylvania State University Press [c1968]
Description:ix, 513 p. illus. 24 cm.
Language:English
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/1245675
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Other authors / contributors:Hasiguti, Ryukiti R., 1914-1996 ed.
Notes:Includes bibliographies.

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