Dependable embedded systems /

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Bibliographic Details
Imprint:Cham : Springer, [2021]
Description:1 online resource (xiii, 608 pages) : illustrations (chiefly color)
Language:English
Series:Embedded systems, 2193-0155
Embedded systems (Springer (Firm))
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/12609839
Hidden Bibliographic Details
Other authors / contributors:Henkel, J. (Jörg), editor.
Dutt, Nikil, editor.
ISBN:9783030520175
303052017X
3030520161
9783030520168
9783030520182
3030520188
9783030520199
3030520196
9783030520168
Digital file characteristics:text file
PDF
Notes:Includes bibliographical references and index.
Open access
Online resource; title from PDF title page (SpringerLink, viewed February 23, 2021).
Summary:This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today's points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
Other form:3030520161
Standard no.:10.1007/978-3-030-52017-5

MARC

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245 0 0 |a Dependable embedded systems /  |c Jörg Henkel, Nikil Dutt, editors. 
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490 1 |a Embedded systems,  |x 2193-0155 
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520 |a This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today's points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems. 
505 0 |a Introduction -- Design of efficient, dependable SoCs based on cross-layer-reliability approach with emphasis on wireless communication as application and DRAM memories -- CRAU: Compositional System-Level Reliability Analysis in the Presence of Uncertainties -- Semantics-aware Soft Error Handling for Embedded Systems using Compiler-OS Interaction -- ARES: Self-Adaptive Coarse-Grained Reconfigurable Architectures as Reliability Enhancers in Embedded Systems -- Cross-Layer Techniques for Dependable Software Execution on Embedded Systems -- Ambrosia: Cross-layer Modeling and Mitigation of Aging Effects in Embedded Systems -- Cross-Layer Dependability for Embedded Hardware/Software Systems -- Fault-Tolerant Computing with Heterogeneous Hardware/Software Hardening Modes -- Robust Computing for Machine Learning-Based Systems -- Hardening embedded system software -- LIFT: Lifting Device-Level Characteristics for Error Resilient System Level Design: A Crosslayer Approach -- VirTherm-3D: Communication Virtualization Enabling System Management for Dependable 3D MPSoCs -- OTERA: Online Test Strategies for Reliable Reconfigurable Architectures -- Variability-Aware Software: Recent Results and Contributions -- EM Lifetime Constrained Optimization for Multi-Segment Power Grid Networks -- Lightweight Software-Assisted Memory Error Correction -- Reliability-Driven Resource Management for Multi-Core Systems-on-Chip -- Monitor Circuits for Device-Circuit Interaction -- PERCIES: Providing Efficient Reliability in Critical Embedded Systems. 
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