X-ray phase-contrast imaging using near-field speckles /

X-ray phase-contrast imaging using near-field speckles /

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Bibliographic Details
Author / Creator:Zdora, Marie-Christine, author.
Edition:1st ed. 2021.
Imprint:Cham, Switzerland : Springer, [2021]
Description:1 online resource (xxi, 337 pages, 102 illustrations, 88 illustrations in color)
Language:English
Series:Springer Theses, Recognizing Outstanding Ph.D. Research, 2190-5053
Springer theses.
Subject:
Phase contrast magnetic resonance imaging.
Physics.
Phase contrast magnetic resonance imaging.
Physics.
Electronic books.
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/12611656
Hidden Bibliographic Details
ISBN:3030663299
9783030663292
3030663280
9783030663285
Digital file characteristics:text file PDF
Notes:Includes bibliographical references.
Description based on online resource; title from digital title page (viewed on May 18, 2021).
Summary:This thesis presents research on novel X-ray imaging methods that improve the study of specimens with small density differences, revealing their inner structure and density distribution. Exploiting the phase shift of X-rays in a material can significantly increase the image contrast compared to conventional absorption imaging. This thesis provides a practical guide to X-ray phase-contrast imaging with a strong focus on X-ray speckle-based imaging, the most recently developed phase-sensitive method. X-ray speckle-based imaging only requires a piece of abrasive paper in addition to the standard X-ray imaging setup. Its simplicity and robustness combined with the compatibility with laboratory X-ray sources, make it an ideal candidate for wide user uptake in a range of fields. An in-depth overview of the state of the art of X-ray speckle-based imaging and its latest developments is given in this thesis. It, furthermore, explores a broad range of applications, from X-ray optics characterisation, to biomedical imaging for 3D virtual histology and geological studies of volcanic rocks, demonstrating is promising potential. Moreover, the speckle-based technique is placed in the context of other phase-sensitive X-ray imaging methods to assist in the choice of a suitable method, hence serving as a guide and reference work for future users.
Standard no.:10.1007/978-3-030-66329-2.
Table of Contents:
  • Introduction
  • Principles of X-Ray Imaging
  • Synchrotron Beamlines, Instrumentation and Contributions
  • X-ray Single-Grating Interferometry
  • Principles and State of the Art Of X-Ray Speckle-Based Imaging
  • The Unified Modulated Pattern Analysis
  • At-Wavelength Optics Characterisation Via X-Ray Speckle- And Grating-Based Unified Modulated Pattern Analysis
  • 3d Virtual Histology Using X-Ray Speckle With The Unified Modulated Pattern Analysis
  • Recent Developments and Ongoing Work In X-Ray Speckle-Based Imaging
  • Summary, Conclusions and Outlook
  • Appendices.

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