Applied aspects of modern metrology /

Applied aspects of modern metrology /

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Bibliographic Details
Imprint:London : IntechOpen, 2022.
Description:1 online resource
Language:English
Subject:
Metrology.
Metrology.
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/13480281
Hidden Bibliographic Details
Other authors / contributors:Velychko, Oleh, editor.
ISBN:9781803550497
180355049X
9781803550480 (hbk.)
9781803550503
1803550503
Notes:Description based on CIP data; resource not viewed.
Other form:Print version : 9781803550480
Description
Physical Description:1 online resource
ISBN:9781803550497
180355049X
9781803550480
9781803550503
1803550503

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