EUV, X-ray, and gamma-ray instrumentation for astronomy III : 22-24 July 1992, San Diego, California /
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Imprint: | Bellingham, Wash., USA : SPIE, c1992. |
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Description: | xii, 537 p. : ill. ; 28 cm. |
Language: | English |
Series: | Proceedings / SPIE--the International Society for Optical Engineering ; v. 1743 Proceedings of SPIE--the International Society for Optical Engineering v. 1743. |
Subject: | |
Format: | Print Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/1451509 |