A programmable reverse-bias safe operating area transistor tester

A programmable reverse-bias safe operating area transistor tester

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Bibliographic Details
Author / Creator:	Berning, David W.
Imprint:	Gaithersburg, Md. : U.S. Dept. of Commerce, National Institute of Standards and Technology ; Washington, D.C. : For sale by the Supt. of Docs., U.S. G.P.O., 1990.
Description:	iv, 54 p. : ill. ; 28 cm.
Language:	English
Series:	Semiconductor measurement technology NIST special publication ; 400-87 NBS special publication 400-87.
Subject:	Transistors -- Testing. Transistors -- Testing.
Format:	Microform U.S. Federal Government Document Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/1457076

Hidden Bibliographic Details
Other authors / contributors:	National Institute of Standards and Technology (U.S.)
Notes:	"August 1990." "CODEN: NSPUE2"--t.p. verso. Includes bibliographical references. Microfiche. [Washington, D.C.] : Supt Docs/GPO, 1992. 1 microfiche : negative.

Description
Item Description:	"August 1990." "CODEN: NSPUE2"--t.p. verso.
Physical Description:	iv, 54 p. : ill. ; 28 cm.
Bibliography:	Includes bibliographical references.