A programmable reverse-bias safe operating area transistor tester
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| Author / Creator: | Berning, David W. |
|---|---|
| Imprint: | Gaithersburg, Md. : U.S. Dept. of Commerce, National Institute of Standards and Technology ; Washington, D.C. : For sale by the Supt. of Docs., U.S. G.P.O., 1990. |
| Description: | iv, 54 p. : ill. ; 28 cm. |
| Language: | English |
| Series: | Semiconductor measurement technology NIST special publication ; 400-87 NBS special publication 400-87. |
| Subject: | |
| Format: | Microform U.S. Federal Government Document Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/1457076 |
