Handbook of X-ray spectrometry : methods and techniques /
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| Imprint: | New York, NY : Marcel Dekker, c1993. |
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| Description: | xiv, 704 p. : ill. ; 26 cm. |
| Language: | English |
| Series: | Practical spectroscopy series ; v. 14 Practical spectroscopy v. 14 |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/1470501 |
| Summary: | Provides coverage of all aspects of X-ray spectrometry, including thorough treatments of each X-ray emission analysis technique. The book brings together in-depth discussions of radioisotope X-ray analysis, synchrotron radiation-induced X-ray emission, total reflection X-ray fluorescence analysis and polarized beam X-ray fluorescence analysis. environmental chemists and biochemists, applied physicists, biologists, geologists, metallurgists, and upper-level undergraduate and graduate students in these disciplines. |
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| Physical Description: | xiv, 704 p. : ill. ; 26 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0824784839 |
