Handbook of X-ray spectrometry : methods and techniques /
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| Imprint: | New York, NY : Marcel Dekker, c1993. |
|---|---|
| Description: | xiv, 704 p. : ill. ; 26 cm. |
| Language: | English |
| Series: | Practical spectroscopy series ; v. 14 Practical spectroscopy v. 14 |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/1470501 |
MARC
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| 245 | 0 | 0 | |a Handbook of X-ray spectrometry : |b methods and techniques / |c edited by René E. van Grieken, Andrzej A. Markowicz. |
| 260 | |a New York, NY : |b Marcel Dekker, |c c1993. | ||
| 300 | |a xiv, 704 p. : |b ill. ; |c 26 cm. | ||
| 336 | |a text |b txt |2 rdacontent |0 http://id.loc.gov/vocabulary/contentTypes/txt | ||
| 337 | |a unmediated |b n |2 rdamedia |0 http://id.loc.gov/vocabulary/mediaTypes/n | ||
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| 490 | 1 | |a Practical spectroscopy series ; |v v. 14 | |
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 2 | 0 | |g 1. |t X-ray Physics / |r Andrzej A. Markowicz -- |t App. I. Critical Absorption Wavelengths and Critical Absorption Energies -- |t App. II. Characteristic X-ray Wavelengths [actual symbol not reproducible] and Energies (keV) -- |t App. III. Radiative Transition Probabilities -- |t App. IV. Wavelengths of K Satellite Lines [actual symbol not reproducible] -- |t App. V. Fluorescence Yields and Coster-Kronig Transition Probabilities -- |t App. VI. Coefficients for Calculating the Photoelectric Absorption Cross Sections [tau] (Barns/Atom) Via LN-LN Representation -- |t App. VII. Coefficients for Calculating the Incoherent Collision Cross Sections [sigma][subscript c] (Barns/Atom) Via the LN-LN Representation -- |t App. VIII. Coefficients for Calculating the Coherent Scattering Cross Sections [sigma][subscript R] (Barns/Atom) Via thc LN-LN Representation -- |t App. IX. Total Mass Attenuation Coefficients for Low-Energy Lines -- |t App. X. Correspondence Between Old Siegbahn and New IUPAC Notation X-ray Diagram Lines -- |g 2. |t Wavelength-Dispersive X-ray Fluorescence / |r J. A. Helsen and Andrzej Kuczumow -- |g 3. |t Energy Dispersive X-ray Fluorescencc Analysis Using X-ray Tube Excitation / |r Joseph M. Jaklevic and Robert D. Giauque -- |g 4. |t Spectrum Evaluation / |r Pierre J. M. Van Espen and Koen H. A. Janssens -- |g 5. |t Quantification by XRF Analysis of Infinitely Thick Samples / |r J. L. de Vries and Bruno A. R. Vrebos -- |g 6. |t Quantification in XRF Analysis of Intermediate-Thickness Samples / |r Andrzej A. Markowicz and Rene E. Van Grieken -- |g 7. |t Radioisotope X-ray Analysis / |r John S. Watt -- |g 8. |t Synchrotron Radiation-Induced X-ray Emission / |r Keith W. Jones -- |g 9. |t Total Reflection XRF / |r Heinrich Schwenke and Joachim Knoth -- |g 10. |t Polarized Beam X-ray Fluorescence / |r Richard W. Ryon and John D. Zahrt -- |t Appendix: Crystals That Diffract Selected Characteristic Wavelengths at 2[theta] = [pi]/2 = 90[degree] -- |g 11. |t Particle-Induced X-ray Emission Analysis / |r Willy Maenhaut and Klas G. Malmqvist -- |g 12. |t Electron-Induced X-ray Emission / |r John A. Small -- |g 13. |t Sample Preparation for XRF / |r Jasna Injuk and Rene E. Van Grieken. |
| 650 | 0 | |a X-ray spectroscopy |0 http://id.loc.gov/authorities/subjects/sh85148744 | |
| 650 | 7 | |a X-ray spectroscopy. |2 fast |0 http://id.worldcat.org/fast/fst01181847 | |
| 700 | 1 | 0 | |a Grieken, R. van |q (René) |0 http://id.loc.gov/authorities/names/n87932061 |1 http://viaf.org/viaf/2544432 |
| 700 | 1 | 0 | |a Markowicz, Andrzej |0 http://id.loc.gov/authorities/names/n86068946 |1 http://viaf.org/viaf/24674196 |
| 830 | 0 | |a Practical spectroscopy |v v. 14 |0 http://id.loc.gov/authorities/names/n86730553 | |
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