X-ray spectrometry /
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| Imprint: | New York : M. Dekker, c1978. |
|---|---|
| Description: | xi, 518 p. : ill. ; 24 cm. |
| Language: | English |
| Series: | Practical spectroscopy v. 2 |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/206180 |
