Alphabetical list of compound names, formulae, and references to published infrared spectra; an index to 92,000 published infrared spectra.
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| Corporate author / creator: | American Society for Testing and Materials |
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| Imprint: | Philadelphia [1969] |
| Description: | vii, 608 p. 29 cm. |
| Language: | English |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/2254483 |
| Summary: | These facsimiles of 16 contributions from the symposium held in May 1996 in Orlando provide information on the behavior of materials and structures. The authors describe novel ways to measure point to point deformation (or strain, when normalized), procedures for measuring crack length and the stres |
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| Item Description: | "AMD 34." |
| Physical Description: | vii, 608 p. 29 cm. |
| ISBN: | 0803124031 |
