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| LEADER |
00000cam a2200000 a 4500 |
| 001 |
2343474 |
| 003 |
ICU |
| 005 |
20030520164000.0 |
| 008 |
950913s1995 enka b 001 0 eng u |
| 010 |
|
|
|a 94010486
|
| 020 |
|
|
|a 0471951676 :
|c $96.00
|
| 035 |
|
|
|a (ICU)BID21171017
|
| 040 |
|
|
|a DLC
|c DLC
|d DLC
|d OrLoB-B
|d OCoLC
|
| 041 |
0 |
|
|a eng
|
| 050 |
0 |
0 |
|a QC482.S6
|b L33 1995
|
| 082 |
0 |
0 |
|a 543/.08586
|2 20
|
| 100 |
1 |
|
|a Lachance, G. R.
|0 http://id.loc.gov/authorities/names/n82146615
|1 http://viaf.org/viaf/30892486
|
| 245 |
1 |
0 |
|a Quantitative X-ray fluorescence analysis :
|b theory and application /
|c Gerald R. Lachance, Fernand Claisse.
|
| 260 |
|
|
|a Chichester ;
|a New York :
|b Wiley,
|c c1995.
|
| 300 |
|
|
|a xxii, 402 p. :
|b ill. ;
|c 24 cm.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|0 http://id.loc.gov/vocabulary/contentTypes/txt
|
| 337 |
|
|
|a unmediated
|b n
|2 rdamedia
|0 http://id.loc.gov/vocabulary/mediaTypes/n
|
| 338 |
|
|
|a volume
|b nc
|2 rdacarrier
|0 http://id.loc.gov/vocabulary/carriers/nc
|
| 504 |
|
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|a Includes bibliographical references (p. [387]-394) and indexes.
|
| 505 |
0 |
0 |
|g Pt. I.
|t Theory.
|g Ch. 1.
|t X-Ray Physics.
|g Ch. 2.
|t X-Ray Fluorescence Emissions.
|g Ch. 3.
|t The Fundamental Parameters Approach.
|g Ch. 4.
|t Fundamental Influence Coefficients.
|g Ch. 5.
|t Alpha Coefficient Concept.
|g Ch. 6.
|t Empirical Influence Coefficients.
|g Ch. 7.
|t Global Matrix Effect Correction Approaches.
|g Ch. 8.
|t Special Analytical Contexts.
|g Ch. 9.
|t Analytical Strategies --
|g Pt. II.
|t Application.
|g II.1.
|t X-Ray Physics.
|g II.2.
|t X-Ray Fluorescence Emissions.
|g II.3.
|t The Fundamental Parameters Approach.
|g II.4.
|t Fundamental Influence Coefficients.
|g II.5.
|t Alpha Influence Coefficients.
|g II.6.
|t Empirical Influence Coefficients.
|g II.7.
|t Global Matrix Effect Correction Methods.
|g II.8.
|t Special Analytical Contexts.
|g II.9.
|t Analytical Strategies.
|
| 650 |
|
0 |
|a X-ray spectroscopy.
|0 http://id.loc.gov/authorities/subjects/sh85148744
|
| 650 |
|
0 |
|a X-ray spectroscopy
|x Industrial applications.
|
| 650 |
|
7 |
|a X-ray spectroscopy.
|2 fast
|0 http://id.worldcat.org/fast/fst01181847
|
| 650 |
|
7 |
|a X-ray spectroscopy
|x Industrial applications.
|2 fast
|0 http://id.worldcat.org/fast/fst01181850
|
| 700 |
1 |
|
|a Claisse, F.
|q (Fernand)
|0 http://id.loc.gov/authorities/names/n85824466
|1 http://viaf.org/viaf/94880154
|
| 901 |
|
|
|a ToCBNA
|
| 903 |
|
|
|a HeVa
|
| 035 |
|
|
|a (OCoLC)30158672
|
| 929 |
|
|
|a cat
|
| 999 |
f |
f |
|i d7ea2350-ea51-594a-898b-5a85bd6f14bd
|s f586eeeb-58e3-5435-81df-d2ddb8d9df39
|
| 928 |
|
|
|t Library of Congress classification
|a QC482.S6L330 1995
|l ASR
|c ASR-SciASR
|i 6023067
|
| 927 |
|
|
|t Library of Congress classification
|a QC482.S6L330 1995
|l ASR
|c ASR-SciASR
|e CRERAR
|b 43252006
|i 4010329
|
