Thin films--structure and morphology : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. /

Thin films--structure and morphology : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. /

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Bibliographic Details
Imprint:Pittsburgh, Pa. : Materials Research Society, c1997.
Description:xvii, 793 p. : ill. ; 24 cm.
Language:English
Series:Materials Research Society symposium proceedings ; v. 441
Materials Research Society symposia proceedings ; v. 441.
Subject:
Thin films -- Congresses.
Crystal growth -- Congresses.
Crystal growth.
Thin films.
Conference papers and proceedings.
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/2759100
Hidden Bibliographic Details
Other authors / contributors:Moss, Steven C.
ISBN:1558993452
Notes:Includes bibliographical references and indexes.
Table of Contents:
  • Phase Transformation and Microstructural Properties in Sputtered Versus CVD WSi[subscript x] Films / A. Domenicucci, C. Dehm and S. Loh [et al.]
  • Structural and Surface Morphology Changes in CuInSe[subscript 2] Thin Films as a Function of Cu/In Ratio / P. Fons, S. Niki and A. Yamada [et al.]
  • Phase Selection by Competitive Growth in Ti/Al Thin-Film Diffusion Couples / S. Wohlert, C. Michaelsen and R. Bormann
  • The Effect of Growth Temperature on Atomic Ordering in Ga[subscript 0.52]In[subscript 0.48]P Epilayers Grown on GaAs(001) Substrates by GS-MBE / C. Meenakarn, A. E. Staton-Bevan and M. D. Dawson [et al.]
  • Structural and Chemical Properties of MBE Grown Niobium Overlayers on (110) Rutile / J. Marien, T. Wagner and M. Ruhle
  • Initial Buffer Layers on the Growth of InGaP on Si by MBE / H. Kawanami, S. Ghosh and I. Sakata [et al.]
  • Real-Time Characterization of the Optical Properties of an Ultrathin Surface Reaction Layer During Growth / N. Dietz, N. Sukidi and C. Harris [et al.]
  • Slow Decay of Reflection-High-Energy-Electron-Diffraction Oscillations in [actual symbol not reproducible] / Mitsuhiro Kushibe, Yuriy V. Shusterman and Nikolai L. Yakovlev [et al.]
  • Observation of RHEED Intensity Oscillations During PbSe/CaF[subscript 2]/Si(111) MBE / W. K. Liu, X. M. Fang and P. J. McCann [et al.]
  • STM and X-ray Diffraction Temperature-Dependent Growth Study of SrRuO[subscript 3] PLD Thin Films / M. E. Hawley, Q. X. Jia and G. W. Brown
  • A Study on the Growth of a Ferroelectric Thin Film Using Ionized Cluster Beam Epitaxy Technique and the Application for ULSI Fabrication / Hyun Seok Lee and Man Young Sung
  • Observation of Film Growth Phenomena Using Micromachined Structures / F. DiMeo, Jr., R. E. Cavicchi and S. Semancik [et al.]
  • Effect of Nonhydrostatic Stress on Kinetics and Interfacial Roughness During Solid-Phase Epitaxial Growth in Si / William Barvosa-Carter and Michael J. Aziz
  • Ga[subscript x]In[subscript 1-x]P/GaP Heterostructures on Si(001) Substrate / N. Sukidi, N. Dietz and U. Rossow [et al.]
  • Lateral Grain Growth in Poly-Si Films by Gas Flame High-Temperature Annealing / W. F. Qu, A. Kitagawa and Y. Masaki [et al.]
  • Competitive Motions of Grain Boundary and Free Surface in Selecting Thin Film Morphology / B. Sun, Z. Suo and W. Yang
  • A Study on the Metal-Induced Lateral Crystallization Behavior of Amorphous Silicon Thin Films / Byung-il Lee, Kwang-Ho Kim and Won-Cheol Jeong [et al.]
  • Effects of Addition of Heavy Rare-Earth Elements on the Structures and Resistivities of Al Thin Films for TFT-LCD Interconnects / Shinji Takayama, Naganori Tsutsui and Zheng Zhudan
  • Low-Pressure OMVPE Grown Comprehensive Strained InGaAs QWs Surrounded by Tensile Strained InGaAs Spacers / O. A. Laboutine, A. G. Choo and S. H. Kim [et al.]
  • Formation and Properties of Roughened Poly-Si Electrodes for High-Density Drams / H. W. Liu, Z. J. Lin and S. Y. Yu [et al.]
  • Epitaxial Variants and Grain Boundary Structures in Heteroepitaxial Lithium Tantalate on Basal Sapphire / Robert A. Bellman and Rishi Raj
  • Domain Structure and Transient Photoconductivity in Ordered Ga[subscript 0.47]In[subscript 0.53]As Epitaxial Films / S. P. Ahrenkiel, R. K. Ahrenkiel and D. J. Arent
  • Structure and Morphology of MBE Fabricated Zn[subscript 0.5]Fe[subscript 0.5]Se on GaAs as a Function of Substrate Preparation and Growth Temperature / H.-Y. Wei, L. Salamanca-Riba and J. Smathers [et al.]
  • Pb-Induced Layer-by-Layer Growth and the Dependence on an Amount of Surfactant in the Growth of Ni on Ni(100) Surface / M. Iwanami, M. Kamiko and T. Matsumoto [et al.]
  • A Molecular-Dynamics Simulation on Thin-Film Formation Process of Surfactant-Mediated Growth / Y. Sasajima, A. Iljima and S. Ozawa [et al.]
  • Generation and Suppression of Stacking Faults in GaP Layers Grown on Si(100) Substrates by Molecular-Beam Epitaxy and Migration-Enhanced Epitaxy / Y. Takagi, H. Yonezu and K. Samonji [et al.]
  • Influence of Substrate Misorientation on Facet Formation in Selective Area Metalorganic Chemical Vapor Deposition / Hyunchol Shin and Young-Se Kwon
  • Effects of Reactive Gas Compositions on the Magnetic Properties and Microstructures of FeTaNC Films / Tae-Hyuk Koh, Dong-Hoon Shin and Woon Choi [et al.]
  • Silicon L[subscript 2,3]-Edge XANES Study of Platinum Silicide Thin Films / S. J. Naftel, T. K. Sham and S. R. Das [et al.]
  • Carrier Transport in Ordered and Disordered In[subscript 0.53]Ga[subscript 0.47]As / R. K. Ahrenkiel, S. P. Ahrenkiel and D. J. Arent [et al.]
  • Microstructure of Compositionally Modulated InAlAs / R. D. Twesten, J. Mirecki Millunchick and S. P. Ahrenkiel [et al.]
  • Epitaxial Growth and Structure of Highly Mismatched Oxide Films with Rocksalt Structure on MgO / P. A. Langjahr, T. Wagner and F. F. Lange [et al.]
  • MOCVD Growth of ZnCdSe on InP(001) Substrates / Hon-Kit Won and S. K. Hark
  • Preparation of PZT Thin Films on Pt/Ti/SiO[subscript 2] and Pt/SiO[subscript 2] Substrates by ECR Plasma-Enhanced dc Magnetron Multitarget Reactive Sputtering / Sung-Tae Kim, Hyun-Ho Kim and Moon-Yong Lee [et al.]
  • Changes in Structure and Composition of Silicon Oxide Thin Films Induced by Ultraviolet Illumination / E. G. Parada, P. Gonzalez and B. Leon [et al.]
  • Excimer Laser Fabrication of Polycrystalline ZrO[subscript 2] Layers / N. Starbov, B. Mednikarov and V. Mankov [et al.]
  • XPS Study of Excimer Laser-Reconstructed Alumina Surface / D. G. Georgiev, K. Kolev and L. D. Laude [et al.]
  • Structural and Electrical Properties of Hg[subscript x]Zn[subscript 1-x]S Thin Films Prepared by Flash Evaporation Technique / P. K. Swain, H. K. Sehgal and D. Misra
  • SnO[subscript 2]:F Thin Films with High Fluorine Contents Produced by Spray Pyrolysis at Constant Substrate Temperature / D. R. Acosta, E. Zironi and W. Estrada [et al.]
  • Transmission-Electron-Microscopy Study of Interface Microstructure in ZnO Thin Films Grown on Various Substrates (Glass, Au, Al, [actual symbol not reproducible]) / Y. Yoshino, S. Iwasa and H. Aoki [et al.]
  • The Atomic Fe/Ag Exchange on Ag(100) / M. H. Langelaar and D. O. Boerma
  • In Situ TEM Analysis of TiSi[subscript 2] C49-C54 Transformations During Annealling / L. M. Gignac, V. Svilan and L. A. Clevenger [et al.]
  • The Nucleation of Crystalline TiSi[subscript 2] Phases From Amorphous TiSi[subscript x] Layers and Interfacial Layers / R. T. Tung, K. Fujil and K. Kikuta [et al.]
  • Study on Thermal Stability of Thin CoSi[subscript 2] Film / Zhi-Guang Gu, Paul K. Chu and Jing Liu [et al.]
  • Structural and Electrical Characterization of TiB[subscript 2]/TiSi[subscript 2] Bilayer Barrier Structure / G. Sade, J. Pelleg and A. Grisaru
  • TiSi[subscript 2] Phase Transformation by Amorphization Techniques / Tord Karlin, Martin Samuelsson and Stefan Nygren [et al.]
  • Doping Properties of the Ion-Beam-Sputtered SiGe Film / Wen-Jie Qi, Zhi-Sheng Wang and Zhi-Guang Gu [et al.]
  • In Situ X-ray Diffraction Analysis of TiSi[subscript 2] Phase Formation From a Titanium-Molybdenum Bilayer / C. Cabral, Jr., L. A. Clevenger and J. M. E. Harper [et al.]
  • Effect of Boron Doping on the C49 to C54 Phase Transformation in TiSi(100) Bilayers / A. Quintero, M. Libera and C. Cabral, Jr. [et al.]
  • Microstructure Control for Thin-Film Metallization / G. S. Was, D. J. Srolovitz and Z. Ma [et al.]
  • Diffusion Barrier Reliability With Respect to the Role of TiN Stoichiometry Between Al Metallization and Si Substrate / Han-Yu Tseng, Aris Christou and Dan Young [et al.]
  • Atomic-Force-Microscopy Investigation of the Morphology of a uv Photodefined Palladium Activation Layer on Alumina Ceramic and the Nucleation of Electroless Copper of the Activated Sites / E. J. Lafferty, D. J. Macauley and P. V. Kelly [et al.]
  • (100) Oriented Platinum Thin Films Deposited by dc Magnetron Sputtering on SiO[subscript 2]/Si Substrates / Dong-Yeon Park, Dong-Su Lee and Min Hong Kim [et al.]
  • Characterization of Platinum Films Deposited by a Two-Step Magnetron Sputtering on SiO[subscript 2]/Si Substrates / Dong-Su Lee, Dong-Yeon Park and Min Hong Kim [et al.]
  • Formation and Phase Transformation of rt Sputter Deposited Non-BCC [delta]-A15 Chromium Thin Films / J. P. Chu, J. W. Chang and P. Y. Lee [et al.]
  • Structural Transition in Cu/Fe Multilayered Thin Films / Tai D. Nguyen, Alison Chalken and Troy W. Barbee, Jr.
  • Compliant Substrates for Reduction of Strain Relief in Mismatched Overlayers / Carrie Carter-Coman, Robert Bicknell-Tassius and April S. Brown [et al.]
  • Structural Transformations Due to Intermixing During Deposition of Fe/Pt(001) Epitaxial Multilayers / T. C. Hufnagel, M. C. Kautzky and V. Ramaswamy [et al.]
  • In Situ Measurements of Islanding and Strain Relaxation of Ge/Si(111) / P. W. Deelman, L. J. Schowalter and T. Thundat
  • Depth-Sensitive Strain Analysis of a W/Ta/W Trilayer / S. G. Malhotra, Z. U. Rek and S. M. Yalisove [et al.]
  • Native Oxide and the Residual Stress of Thin Mo and Ta Films / L. J. Parfitt, Z. U. Rek and S. M. Yalisove [et al.]
  • Surface Roughening, Columnar Growth, and Intrinsic Stress Formation in Amorphous CuTi Films / U. V. Hulsen, P. Thiyagarajan and U. Geyer
  • Stress-Driven Wrinkling of [alpha]-Alumina Films Grown on Fe-Cr-Al by Thermal Oxidation / Vladimir K. Tolpygo and David R. Clarke
  • Stress and Microstructural Evolution of LPCVD Polysilicon Thin Films During High-Temperature Annealing / Chia-Liang Yu, Paul A. Flinn and Seok-Hee Lee [et al.]
  • Structure and Magnetic Properties of Epitaxial Ordered FePd(001) Thin Films / V. Gehanno, A. Marty and B. Gilles
  • Nanocharacterization of Texture and Hillock-Formation in Thin Al and Al-0.2%Cu Films for Thin-Film Transistors / H. Takatsuji, S. Tsuji and H. Kitahara [et al.]
  • In Situ TEM Characterization of Whiskers on Al Electrodes for Thin-Film Transistors / K. Tsujimoto, S. Tsuji and H. Saka [et al.]
  • Stress of Platinum Thin Films Deposited by dc Magnetron Sputtering Using Argon/Oxygen Gas Mixture / Min Hong Kim, Tae-Soon Park and Dong-Su Lee [et al.]
  • Stress and Its Effect on Surface Morphology in Multilayer Ti-Cu Films / Ping Zhou, Saps Buchman and Chris Gray [et al.]
  • Effect of Stress on Coherently Grown Au-Ni(001) Solid Solutions / G. Abadias, V. Gehanno and A. Marty [et al.]
  • TEM Study of Strain Compensated InP/GaAs/GaP/GaAs Superlattice Structures / I. Rusakova, A. H. Bensaoula and A. Bensaoula
  • Correlation Between Structural and Electronical Properties of Strained V[subscript 2]O[subscript 3] Thin Films / H. Schuler, S. Kilmm and S. Horn
  • Structural Studies of Epitaxial CdF[subscript 2] Layers on Si(111) / A. Yu. Khilko, R. N. Kyutt and G. N. Mosina [et al.]
  • Comparison of the Hafnium Diboride (0001) and Hafnium(0001) Surfaces / M. Belyansky, M. Trenary and S. Otani [et al.]
  • Thin-Film Deposition Via Pulsed Laser Ablation / V. G. Panayotov, M. C. Kelly and G. G. Gomlak [et al.]
  • Microraman Spectroscopy and X-ray Diffraction Studies of Ti-W-O Thin Films / Luigi Sangaletti, Elza Bontempi and Laura E. Depero [et al.]
  • Characterization of Co-Cr-Mo Alloys Used in Hip Implant Articulating Surfaces / R. Varano, J. D. Bobyn and S. Yue
  • Atomic-Force-Microscopy Study of Hard Coating Films Prepared by Pulsed Laser Deposition Method / Hsieh-Li Chan, Ashok Kumar and L. Sanderson [et al.]
  • Substrate Curvature Change Due to Morphological Instability of a Strained Epitaxial Surface Film / F. Jonsdottir and L. B. Freund
  • Stress and Temperature Dependence of Misfit Dislocation Nucleation Rate in SiGe Alloys: Evidence of Homogeneous Nucleation / S. M. Labovitz, Y. H. Xie and D. P. Pope
  • 3-D Atomistic Kinetic Monte Carlo Simulations of Point Defect Incorporation During CVD Diamond Film Growth / C. Battaile, D. J. Srolovitz and J. E. Butler
  • Thin-Film Growth as a Result of Cluster-Surface Collisions: Computational Simulations / L. Qi and S. B. Sinnott
  • Cluster Model Study to the As[subscript 2]-Adsorption on GaAs(001) Surfaces / T. Marek, H. P. Strunk and S. Kunsagi-Mate [et al.]
  • Morphology Studies of Oxide Films Deposited by rf Plasma Technique / D. J. Hunt, R. W. Moss and J. E. Olson [et al.]
  • Low-Temperature Epitaxial Growth of CeO[subscript 2](110) Layers on Si(100) Using Bias Evaporation / Tomoyasu Inoue, Yasuhiro Yamamoto and Masataka Satoh
  • Monte Carlo Modeling of Atom Transport During Directed Vapor Deposition / J. F. Groves and H. N. G. Wadley
  • Epitaxial BaTiO[subscript 3] and KNbO[subscript 3] Thin Films on Various Substrates for Optical Waveguide Applications / L. Beckers, W. Zander and J. Schubert [et al.]
  • Pulsed Laser Deposition of Barium Zirconate Thin Films for Neutral Imaging Applications / R. Leuchtner, R. Yanochko and J. Krzanowski [et al.]
  • In Situ Optical Diagnostics During Pulsed Laser Deposition of Magnetoresistive La-Ca-Mn-O Films on Silicon Substrates / P.-J. Kung, J. E. Cosgrove and K. Kinsella [et al.]
  • Cadmium Sulfide Films Deposited by CW Laser Evaporation Technique / R. W. Moss, J. Harris and D. H. Lee [et al.]
  • Laser-Assisted Molecular-Beam Deposition of Si, C, and SiC Films / R. L. DeLeon, L. Sun and E. Rexer [et al.]
  • Low-Temperature Epitaxy of Si on Dihydride-Terminated Si(001): Energetic Versus Thermal Growth / M. E. Taylor, Harry A. Atwater and M. V. Ramana Murty
  • Estimation of Minimum Liquidus Free Energy Concentration for Silicide and Germanide Systems / H. G. Nam and N.-I. Cho
  • van der Waals Epitaxy of Transition-Metal Dichalcogenides Using Metalorganic Precursors (MOVDWE) / S. Tiefenbacher, C. Pettenkofer and W. Jaegermann
  • van der Waals Epitaxy of II-VI Semiconductors on Layered Chalcogenide (0001) Substrates: Toward Buffer Layers for Lattice-Mismatched Systems? / T. Loher, A. Klein and E. Schaar-Gabriel [et al.]
  • Scanning Transmission X-ray Microscopy Study of TiSe[subscript 2]/NbSe[subscript 2] Superlattices / Hyun-Joon Shin, Kwangho Jeong and David C. Johnson [et al.]
  • The Synthesis and Superconducting Behavior of Crystalline Superlattices: [actual symbol not reproducible] / Myungkeun Noh and David C. Johnson
  • Photoluminescence, Electroluminescence, and Cathodoluminescence of ZnO:Zn Phosphor Films Prepared by MOCVD / Y. Li, E. Forsythe and G. S. Tompa [et al.]
  • Time-Resolved RHEED Studies of the Growth of Epitaxial ZnSe Films on GaAs by Pulsed Laser Deposition / James W. McCamy and Michael J. Aziz
  • Surface Structure and Morphology Modification of Silicon Layers Induced by Nanosecond Pulsed Laser Irradiation / A. Demchuk
  • Morphology and Quantitative Nitrogen Impurity Measurements In Homoepitaxial Chemical Vapor-Deposited Diamond / S. A. Catledge, Y. K. Vohra and C. Yan [et al.]
  • Control of the Hydrogen Content of Diamondlike Carbon Films Deposited Using Unbalanced Magnetron Sputtering / S.-C. Seo and D. C. Ingram
  • Laser and Thermal Annealing Modification of Diamondlike Atomic-Scale Composite Films Studied by Micro-Raman Spectroscopy / J. Z. Wan, Fred H. Pollak and Benjamin F. Dorfman
  • Determination of Film Growth Rate and Surface Roughness Using In Situ Pyrometry / Z. Yin, Z. L. Akkerman and F. W. Smith [et al.]
  • Diamond Growth on (a) Large Mo Cylinders at 30 Torr and (b) Flat Mo at One Atmospheric Pressure of H[subscript 2] and CH[subscript 4] / R. Ramesham and M. F. Rose
  • Plasma Etching and Patterning of CVD Diamond at [actual symbol not reproducible] for Microelectronics Applications / R. Ramesham, W. Welch and W. C. Neely [et al.]
  • A Study on the Residual Stress of Diamondlike Carbon Films Deposited by Magnetically Enhanced rf PECVD / Woon Choi, Dong-Hoon Shin and Seoung-Eui Nam [et al.]
  • Wear Resistant Amorphous PVD B-N-C films for Tribological Applications / O. Knotek, E. Lugscheider and C. Barimani [et al.]
  • Effects of the Plasma Conditions on the Bonding Type in Carbon Nitride Thin Films / J. M. Mendez, S. Muhl and A. Gaona-Couto [et al.]
  • Growth of SiCN Crystals Consisting of a Predominantly Carbon Nitride Network / D. M. Bhusari, C. K. Chen and K. H. Chen [et al.]
  • Influence of HCl and H[subscript 2] on the Heteroepitaxial Growth of 3C-SiC Films on Si(100) Via Low-Temperature Chemical Vapor Deposition / J. H. Edgar and Y. Gao
  • Growth of Cubic SiC Thin Films on Silicon From Single-Source Precursors by Supersonic Jet Epitaxy / Jin-Hyo Boo, Scott A. Ustin and Wilson Ho [et al.]
  • Nanostructure Study of Ti/TiN Multilayers: Effect of the Deposition Temperature / S. Labdi, C. Sant and L. Hennet [et al.]
  • Synthesis of Crystalline C[subscript 3]N[subscript 4] Films and the New C-N Phases / Yan Chen, D. J. Johnson and R. H. Prince [et al.]
  • New Silicon-Carbon Materials Incorporating Si[subscript 4]C Building Blocks / D. Chandrasekhar, J. Kouvetakis and J. McMurran [et al.]
  • Nonlinear Optical Mapping of Cubic Silicon Carbide Micron Areas in Epitaxial Films of Hexagonal Polytypes / G. Lupke, C. Meyer and O. Busch [et al.]
  • Thermodynamic Analysis of Blanket and Selective Epitaxy of SiC on Si and SiO[subscript 2] Masked Si / Y. Gao and J. H. Edgar
  • Radiochromic Thin-Film Sensor Using Blue Tetrazolium in Polyvinyl Alcohol / C.-K. Hsu, M. Al-Sheikhly and W. L. McLaughlin [et al.]
  • Measurement of Quasi-Fermi Levels in Quantum Well Lasers / J. Therrien, S. Mil'shtein and A. Chin
  • Structural and Optical Properties of Electrochromic Nickel Oxide Films / Kensuke Murai, Yoshiyuki Sato and Shigeharu Tamura
  • Simultaneous Monitoring of Wafer- and Environment-States During Molecular-Beam Epitaxy / K. J. Knopp, J. R. Ketterl and D. H. Christensen [et al.]
  • Strain Effects in Heteroepitaxial Growth: Island and Dot Formation Kinetics / D. R. M. Williams and L. M. Sander
  • Cross-Sectional Transmission Electron Microscopy of Si-Based Nanostructures / Maxim V. Sidorov and David J. Smith
  • Multilayer Fresnel Zone Plate for 8KeV X-ray by dc Magnetron Sputtering Deposition / S. Tamura, K. Mori and T. Maruhashi [et al.].
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