Surface infrared and Raman spectroscopy : methods and applications /
Saved in:
| Author / Creator: | Suëtaka, W. |
|---|---|
| Imprint: | New York : Plenum Press, c1995. |
| Description: | xiii, 270 p. : ill. ; 24 cm. |
| Language: | English |
| Series: | Methods of surface characterization. v. 3 |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/3690196 |
Table of Contents:
- 1. Introduction. 1. Surface Analysis. 2. Infrared and Raman Observation of Chemical Species on Bulk Solid Substrates
- 2. Infrared External Reflection Spectroscopy. 1. Oblique Incidence Reflection Method. 2. Polarization and Wavelength Modulation Methods. 3. Potential Modulation Method
- 3. Internal Reflection Spectroscopy. 1. Attenuated Total Reflection Spectroscopy. 2. Absorption Enhancement by the Presence of a Metal Layer
- 4. Infrared Emission Spectroscopy. 2. Optimum Experimental Conditions. 3. Instrumentation and Application of Infrared Emission Spectroscopy
- 5. Surface Raman Spectroscopy. 2. Optimum Conditions for the Measurement of Surface Raman Spectra. 3. Applications
- 6. Surface Enhanced Raman Scattering. 2. Mechanism of Enhancement. 3. Applications.
