Characterization of crystal growth defects by X-ray methods /

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Bibliographic Details
Meeting name:NATO Avanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods (1979 : Durham, England)
Imprint:New York, N.Y. : Plenum Press, [1980]
Description:xxvi, 589 : ill. ; 26 cm.
Language:English
Series:NATO advanced study institutes series. Series B, Physics v. 63
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/408952
Hidden Bibliographic Details
Other authors / contributors:Tanner, B. K. (Brian Keith)
Bowen, D. Keith (David Keith), 1940-
ISBN:0306406284
Notes:"Published in cooperation with NATO Scientific Affairs Division."
"Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held Aug. 29-Sept. 10, 1979, at Durham University, Durham, U. K."

MARC

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