Characterization of crystal growth defects by X-ray methods /
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| Meeting name: | NATO Avanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods (1979 : Durham, England) |
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| Imprint: | New York, N.Y. : Plenum Press, [1980] |
| Description: | xxvi, 589 : ill. ; 26 cm. |
| Language: | English |
| Series: | NATO advanced study institutes series. Series B, Physics v. 63 |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/408952 |
