EUV, x-ray, and gamma-ray instrumentation for astronomy X : 21-23 July 1999, Denver, Colorado /
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Imprint: | Bellingham, Wash., USA : SPIE, c1999. |
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Description: | xvi, 838 p. : ill. (some col.) ; 28 cm. |
Language: | English |
Series: | SPIE proceedings series ; v. 3765 Proceedings of SPIE--the International Society for Optical Engineering ; v. 3765. |
Subject: | |
Format: | Print Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/4234249 |
Physical Description: | xvi, 838 p. : ill. (some col.) ; 28 cm. |
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Bibliography: | Includes bibliographical references and index. |
ISBN: | 0819432512 |