Proceedings of the ACM SIGSOFT ... Symposium on Software Testing, Analysis, and Verification
Saved in:
Meeting name: | Symposium on Testing, Analysis, and Verification. |
---|---|
Imprint: | New York, N.Y. : ACM |
Language: | English |
Subject: | |
Format: | E-Resource Journal |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/4395870 |
Related Items: | Continued by:
Proceedings of the ... International Symposium on Software Testing and Analysis |