Proceedings of the ACM SIGSOFT ... Symposium on Software Testing, Analysis, and Verification
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Meeting name: | Symposium on Testing, Analysis, and Verification. |
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Imprint: | New York, N.Y. : ACM |
Language: | English |
Subject: | |
Format: | E-Resource Journal |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/4395870 |
Related Items: | Continued by:
Proceedings of the ... International Symposium on Software Testing and Analysis |
Varying Form of Title: | International Symposium on Software Testing and Analysis TAV Proceedings of the Symposium on Testing, Analysis, and Verification |
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Other authors / contributors: | ACM Sigsoft. ACM Digital Library. |
Date / volume: | Began with 3rd (1989) Ceased with 4th (1991) |
Notes: | Description based on: 3rd (1989); title from conference proceedings series home page (viewed Mar. 22, 2001). Subscription and registration required for access. Citations available in HTML; full-text in PDF file format. Also available in print. System requirements: Internet connectivity, World Wide Web browser, and Adobe Acrobat Reader. Mode of access: World Wide Web. |
Other form: | Symposium on Testing, Analysis, and Verification. Proceedings of the ACM SIGSOFT ... Symposium on Software Testing, Analysis, and Verification (TAV) |
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