Total least squares and errors-in-variables modeling : analysis, algorithms and applications /

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Bibliographic Details
Imprint:Dordrecht : London : Kluwer Academic, c2002.
Description:x, 397 p. : ill. ; 25 cm.
Language:English
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/4672780
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Other authors / contributors:Lemmerling, Philippe.
Van Huffel, Sabine.
ISBN:1402004761
Notes:Includes papers from 3rd international workshop on TLS and EIV modeling, Leuven, Aug. 27-29, 2001.
Includes bibliographical references and index.

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