High-resolution imaging and spectrometry of materials /
Saved in:
| Imprint: | Berlin ; New York : Springer, c2003. |
|---|---|
| Description: | xiv, 440 p. : ill. ; 24 cm. |
| Language: | English |
| Series: | Springer series in materials science, 0933-033X ; 50 Springer series in materials science ; v. 50. |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/4840334 |
MARC
| LEADER | 00000pam a22000004a 4500 | ||
|---|---|---|---|
| 001 | 4840334 | ||
| 003 | ICU | ||
| 005 | 20040128145600.0 | ||
| 008 | 020822s2003 gw a b 001 0 eng | ||
| 010 | |a 2002030612 | ||
| 020 | |a 3540418180 (alk. paper) | ||
| 040 | |a DLC |c DLC |d DLC |d OCoLC |d OrLoB-B | ||
| 042 | |a pcc | ||
| 050 | 0 | 0 | |a TA417.23 |b .H534 2003 |
| 082 | 0 | 0 | |a 620.1/1299 |2 21 |
| 245 | 0 | 0 | |a High-resolution imaging and spectrometry of materials / |c F. Ernst, M. Rühle (eds.). |
| 260 | |a Berlin ; |a New York : |b Springer, |c c2003. | ||
| 300 | |a xiv, 440 p. : |b ill. ; |c 24 cm. | ||
| 336 | |a text |b txt |2 rdacontent |0 http://id.loc.gov/vocabulary/contentTypes/txt | ||
| 337 | |a unmediated |b n |2 rdamedia |0 http://id.loc.gov/vocabulary/mediaTypes/n | ||
| 338 | |a volume |b nc |2 rdacarrier |0 http://id.loc.gov/vocabulary/carriers/nc | ||
| 490 | 1 | |a Springer series in materials science, |x 0933-033X ; |v 50 | |
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | 0 | |g 1. |t Microcharacterisation of Materials / |r F. Ernst and W. Sigle -- |g 2. |t Electron Scattering / |r H. Muller and H. Rose -- |g 3. |t Structure Determination by Quantitative High-Resolution Electron Microscopy (Q-HRTEM) / |r G. Mobus -- |g 4. |t Quantitative Analytical Transmission Electron Microscopy / |r P. Kohler-Redlich and J. Mayer -- |g 5. |t Advances in Electron Optics / |r H. Rose -- |g 6. |t Tomography by Atom Probe Field Ion Microscopy / |r T. Al-Kassab, H. Wollenberger, G. Schmitz and R. Kirchheim -- |g 7. |t Scanning Tunneling Microscopy (STM) and Spectroscopy (STS), Atomic Force Microscopy (AFM) / |r H. Neddermeyer and M. Hanbucken -- |g 8. |t Multi-Method High-Resolution Surface Analysis with Slow Electrons / |r E. Bauer and T. Schmidt -- |g 9. |t From Microcharacterization to Macroscopic Property: A Pathway Discussed on Metal/Ceramic Composites / |r J. Rodel -- |g 10. |t Microstructural Characterization of Materials: An Assessment / |r R. W. Cahn, G. Ertl and J. Heydenreich. |
| 650 | 0 | |a Materials |x Microscopy. |0 http://id.loc.gov/authorities/subjects/sh85082081 | |
| 650 | 0 | |a Transmission electron microscopy. |0 http://id.loc.gov/authorities/subjects/sh93001918 | |
| 650 | 7 | |a Materials |x Microscopy. |2 fast |0 http://id.worldcat.org/fast/fst01011856 | |
| 650 | 7 | |a Transmission electron microscopy. |2 fast |0 http://id.worldcat.org/fast/fst01154860 | |
| 700 | 1 | |a Rühle, Manfred. |0 http://id.loc.gov/authorities/names/n84075047 |1 http://viaf.org/viaf/15003261 | |
| 700 | 1 | |a Ernst, F. |q (Frank), |d 1938- |0 http://id.loc.gov/authorities/names/n2002159875 |1 http://viaf.org/viaf/33827734 | |
| 830 | 0 | |a Springer series in materials science ; |v v. 50. | |
| 903 | |a HeVa | ||
| 035 | |a (OCoLC)50510777 | ||
| 929 | |a cat | ||
| 999 | f | f | |i b3573d4b-d14e-5111-bf46-4441f38d53de |s 94d27fc5-7025-5c90-8ae3-8568bb3927e9 |
| 928 | |t Library of Congress classification |a TA417.23.H534 2003 |l JCL |c JCL-Sci |i 4703456 | ||
| 927 | |t Library of Congress classification |a TA417.23.H534 2003 |l JCL |c JCL-Sci |e CL27 |e CRERAR |b 63568234 |i 7422618 | ||
