High-resolution imaging and spectrometry of materials /
Saved in:
| Imprint: | Berlin ; New York : Springer, c2003. |
|---|---|
| Description: | xiv, 440 p. : ill. ; 24 cm. |
| Language: | English |
| Series: | Springer series in materials science, 0933-033X ; 50 Springer series in materials science ; v. 50. |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/4840334 |
