Transmission electron microscopy and diffractometry of materials /

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Bibliographic Details
Author / Creator:Fultz, B. (Brent)
Edition:2nd ed.
Imprint:Berlin ; New York : Springer, c2002.
Description:xxi, 748 p. : ill. ; 24 cm.
Language:English
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/4852556
Hidden Bibliographic Details
Other authors / contributors:Howe, James M., 1955-
ISBN:3540437649 (alk. paper)
Notes:Includes bibliographical references and index.

MARC

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245 1 0 |a Transmission electron microscopy and diffractometry of materials /  |c Brent Fultz, James Howe. 
250 |a 2nd ed. 
260 |a Berlin ;  |a New York :  |b Springer,  |c c2002. 
300 |a xxi, 748 p. :  |b ill. ;  |c 24 cm. 
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338 |a volume  |b nc  |2 rdacarrier  |0 http://id.loc.gov/vocabulary/carriers/nc 
504 |a Includes bibliographical references and index. 
505 0 0 |g 1.  |t Diffraction and the X-Ray Powder Diffractometer --  |g 2.  |t The TEM and its Optics --  |g 3.  |t Scattering --  |g 4.  |t Inelastic Electron Scattering and Spectroscopy --  |g 5.  |t Diffraction from Crystals --  |g 6.  |t Electron Diffraction and Crystallography --  |g 7.  |t Diffraction Contrast in TEM Images --  |g 8.  |t Diffraction Lineshapes --  |g 9.  |t Patterson Functions and Diffuse Scattering --  |g 10.  |t High-Resolution TEM Imaging --  |g 11.  |t Dynamical Theory. 
650 0 |a Materials  |x Microscopy.  |0 http://id.loc.gov/authorities/subjects/sh85082081 
650 0 |a Transmission electron microscopy.  |0 http://id.loc.gov/authorities/subjects/sh93001918 
650 0 |a X-ray diffractometer.  |0 http://id.loc.gov/authorities/subjects/sh85148734 
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650 7 |a Transmission electron microscopy.  |2 fast  |0 http://id.worldcat.org/fast/fst01154860 
650 7 |a X-ray diffractometer.  |2 fast  |0 http://id.worldcat.org/fast/fst01181828 
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927 |t Library of Congress classification  |a TA417.23.F85 2002  |l JCL  |c JCL-Sci  |e SPIT  |e CRERAR  |b 63671072  |i 7434152