$Transmission electron microscopy and diffractometry of materials /$

Transmission electron microscopy and diffractometry of materials /

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Bibliographic Details
Author / Creator:	Fultz, B. (Brent)
Edition:	2nd ed.
Imprint:	Berlin ; New York : Springer, c2002.
Description:	xxi, 748 p. : ill. ; 24 cm.
Language:	English
Subject:	Materials -- Microscopy. Transmission electron microscopy. X-ray diffractometer. Materials -- Microscopy. Transmission electron microscopy. X-ray diffractometer.
Format:	Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/4852556

Hidden Bibliographic Details
Other authors / contributors:	Howe, James M., 1955-
ISBN:	3540437649 (alk. paper)
Notes:	Includes bibliographical references and index.

Table of Contents:

1. Diffraction and the X-RayPowder Diffractometer
1.1. Diffraction
1.1.1. Introduction to Diffraction
1.1.2. Bragg's Law
1.1.3. Strain Effects
1.1.4. Size Effects
1.1.5. A Symmetry Consideration
1.1.6. Experimental Methods
1.2. The Creation of X-Rays
1.2.1. Bremsstrahlung
1.2.2. Characteristic Radiation
1.2.3. Synchrotron Radiation
1.3. The X-Ray Powder Diffractometer
1.3.1. Practice of X-Ray Generation
1.3.2. Goniometer for Powder Diffraction
1.3.3. Monochromators and Filters
1.4. X-Ray Detectors for XRD and TEM
1.4.1. Detector Principles
1.4.2. Position-Sensitive Detectors
1.4.3. Charge Sensitive Preamplifier
1.4.4. Other Electronics
1.5. Experimental X-Ray Powder Diffraction Data
1.5.1. &ast; Intensities of Powder Diffraction Peaks
1.5.2. Phase Fraction Measurement
1.5.3. Lattice Parameter Measurement
1.5.4. &ast; Refinement Methods for Powder Diffraction Data
1.5.5. &ast; Pair Distribution Function Analysis
Further Reading
Problems
2. The TEM and its Optics
2.1. Introduction to the Transmission Electron Microscope
2.2. Working with Lenses and Ray Diagrams
2.2.1. Single Lenses
2.2.2. Multi-Lens Systems
2.3. Modes of Operation of a TEM
2.3.1. Conventional Modes
2.3.2. Convergent-Beam Electron Diffraction
2.3.3. High-Resolution Imaging
2.4. Real Lens Systems
2.4.1. Illumination Lens Systems
2.4.2. Imaging Lens Systems
2.5. Glass Lenses
2.5.1. Interfaces
2.5.2. Lenses and Rays
2.5.3. Lenses and Phase Shifts
2.6. Magnetic Lenses
2.7. Lens Aberrations and Other Defects
2.7.1. Spherical Aberration
2.7.2. Chromatic Aberration
2.7.3. Diffraction
2.7.4. Astigmatism
2.7.5. Gun Brightness
2.8. Resolution
Further Reading
Problems
3. Scattering
3.1. Coherence and Incoherence
3.1.1. Phase and Energy
3.1.2. Wave Amplitudes and Cross-Sections
3.2. X-Ray Scattering
3.2.1. Electrodynamics of X-Ray Scattering
3.2.2. &ast; Inelastic Compton Scattering
3.2.3. X-Ray Mass Attenuation Coefficients
3.3. Coherent Elastic Scattering
3.3.1. &ddagger; Born Approximation for Electrons
3.3.2. Atomic Form Factors - Physical Picture
3.3.3. &ddagger; Scattering of Electrons by Model Potentials
3.3.4. &ddagger; &ast; Atomic Form Factors - General Formulation
3.4. &ast; Nuclear Scattering
3.4.1. Properties of Neutrons
3.4.2. &ast; Inelastic Neutron Scattering
3.4.3. &ast; Mössbauer Scattering
Further Reading
Problems
4. Inelastic Electron Scattering and Spectroscopy
4.1. Inelastic Electron Scattering
4.2. Electron Energy-Loss Spectrometry (EELS)
4.2.1. Instrumentation
4.2.2. General Features of EELS Spectra
4.2.3. &ast; Fine Structure
4.3. Plasmon Excitations
4.3.1. Plasmon Principles
4.3.2. &ast; Plasmons and Specimen Thickness
4.4. Core Excitations
4.4.1. Scattering Angles and Energies - Qualitative
4.4.2. &ddagger; Inelastic Form Factor
4.4.3. &ddagger; &ast; Double-Differential Cross-Section, d 2 ¿ in /d¿dE
4.4.4. &ast; Scattering Angles and Energies - Quantitative
4.4.5. &ddagger; &ast; Differential Cross-Section, d¿ in /dE
4.4.6. &ddagger; Partial and Total Cross-Sections, ¿ in
4.4.7. Quantification of EELS Core Edges
4.5. &ast; Energy-Filtered TEM Imaging (EFTEM)
4.5.1. &ast; Energy Filters
4.5.2. &ast; Chemical Mapping with Energy-Filtered Images
4.5.3. Chemical Analysis with High Spatial Resolution
4.6. Energy Dispersive X-Ray Spectrometry (EDS)
4.6.1. Electron Trajectories Through Materials
4.6.2. Fluorescence Yield
4.6.3. EDS Instrumentation Considerations
4.6.4. Thin-Film Approximation
4.6.5. &ast; ZAF Correction
4.6.6. Limits of Microanalysis
Further Reading
Problems
5. Diffraction from Crystals
5.1. Sums of Wavelets from Atoms
5.1.1. Electron Diffraction from a Material
5.1.2. Wave Diffraction from a Material
5.2. The Reciprocal Lattice and the Laue Condition
5.2.1. Diffraction from a Simple Lattice
5.2.2. Reciprocal Lattice
5.2.3. Laue Condition
5.2.4. Equivalence of the Laue Condition and Bragg's Law
5.2.5. Reciprocal Lattices of Cubic Crystals
5.3. Diffraction from a Lattice with a Basis
5.3.1. Structure Factor and Shape Factor
5.3.2. Structure Factor Rules
5.3.3. Symmetry Operations and Forbidden Diffractions
5.3.4. Superlattice Diffractions
5.4. Crystal Shape Factor
5.4.1. Shape Factor of Rectangular Prism
5.4.2. Other Shape Factors
5.4.3. Small Particles in a Large Matrix
5.5. Deviation Vector (Deviation Parameter)
5.6. Ewald Sphere
5.6.1. Ewald Sphere Construction
5.6.2. Ewald Sphere and Bragg's Law
5.6.3. Tilting Specimens and Tilting Electron Beams
5.7. Laue Zones
5.8. &ast; Effects of Curvature of the Ewald Sphere
Further Reading
Problems
6. Electron Diffraction and Crystallography
6.1. Indexing Diffraction Patterns
6.1.1. Issues in Indexing
6.1.2. Method 1 - Start with Zone Axis
6.1.3. Method 2 - Start with Diffraction Spots
6.2. Stereographic Projections and Their Manipulation
6.2.1. Construction of a Stereographic Projection
6.2.2. Relationship Between Stereographic Projections and Electron Diffraction Patterns
6.2.3. Manipulations of Stereographic Projections
6.3. Kikuchi Lines and Specimen Orientation
6.3.1. Origin of Kikuchi Lines
6.3.2. Indexing Kikuchi Lines
6.3.3. Specimen Orientation and Deviation Parameter
6.3.4. The Sign of s
6.3.5. Kikuchi Maps
6.4. Double Diffraction
6.4.1. Occurrence of Forbidden Diffractions
6.4.2. Interactions Between Crystallites
6.5. &ast; Convergent-Beam Electron Diffraction
6.5.1. Convergence Angle of Incident Electron Beam
6.5.2. Determination of Sample Thickness
6.5.3. Measurements of Unit Cell Parameters
6.5.4. &ddagger; &ast; Determination of Point Groups
6.5.5. &ddagger; &ast; Determination of Space Groups
6.6. Further Reading
Problems
7. Diffraction Contrast in TEM Images
7.1. Contrast in TEM Images
7.2. A Review of Structure and Shape Factors
7.3. Extinction Distance
7.4. The Phase-Amplitude Diagram
7.5. Fringes from Sample Thickness Variations
7.5.1. Thickness and Phase-Amplitude Diagrams
7.5.2. Thickness Contours in TEM Images
7.6. Bend Contours in TEM Images
7.7. Diffraction Contrast from Strain Fields
7.8. Dislocations and Burgers Vector Determination
7.8.1. Diffraction Contrast from Dislocation Strain Fields
7.8.2. The g · b Rule for Null Contrast
7.8.3. Image Position and Dislocation Pairs or Loops
7.9. Semi-Quantitative Diffraction Contrast from Dislocations
7.10. Weak-Beam Dark-Field (WBDF) Imaging of Dislocations
7.10.1. Procedure to Make a WBDF Image
7.10.2. Diffraction Condition for a WBDF Image
7.10.3. Analysis of WBDF Images
7.11. Fringes at Interfaces
7.11.1. Phase Shifts of Electron Wavelets Across Interfaces
7.11.2. Moiré Fringes
7.12. Diffraction Contrast from Stacking Faults
7.12.1. Kinematical Treatment
7.12.2. Results from Dynamical Theory
7.12.3. Determination of the Intrinsic or Extrinsic Nature of Stacking Faults
7.12.4. Partial Dislocations Bounding the Fault
7.12.5. An Example of a Stacking Fault Analysis
7.12.6. Sets of Stacking Faults in TEM Images
7.12.7. Related Fringe Contrast
7.13. Antiphase (¿) Boundaries and ¿ Boundaries
7.13.1. Antiphase Boundaries
7.13.2. ¿ Boundaries
7.14. Contrast from Precipitates and Other Defects
7.14.1. Vacancies
7.14.2. Coherent Precipitates
7.14.3. Semicoherent and Incoherent Particles
Further Reading
Problems
8. Diffraction Lineshapes
8.1. Diffraction Line Broadening and Convolution
8.1.1. Crystallite Size Broadening
8.1.2. Strain Broadening
8.1.3. Instrumental Broadening - Convolution
8.2. Fourier Transform Deconvolutions
8.2.1. Mathematical Features
8.2.2. Effects of Noise on Fourier Transform Deconvolutions
8.3. Simultaneous Strain and Size Broadening
8.4. &ast; Fourier Methods with Multiple Orders
8.4.1. &ddagger; &ast; Formulation
8.4.2. &ast; Strain Heterogeneity and Peak Asymmetry
8.4.3. &ast; Column Lengths
8.4.4. &ddagger; &ast; Size Coefficients
8.4.5. &ast; Practical Issues in Warren-Averbach Analysis
8.5. Comments on Diffraction Lineshapes
Further Reading
Problems
9. Patterson Functions and Diffuse Scattering
9.1. The Patterson Function
9.1.1. Overview
9.1.2. Atom Centers at Points in Space
9.1.3. Definition of the Patterson Function
9.1.4. Properties of Patterson Functions
9.1.5. &ddagger; Perfect Crystals
9.2. Patterson Functions for Homogeneous Disorder and Atomic Displacement Diffuse Scattering
9.2.1. Deviations from Periodicity
9.2.2. Uncorrelated Displacements
9.2.3. &ast; Correlated Displacements: Atomic Size Effects
9.2.4. &ddagger; Temperature
9.3. Diffuse Scattering from Chemical Disorder
9.3.1. Randomness - Uncorrelated Chemical Disorder
9.3.2. &ddagger; &ast; SRO Parameters
9.3.3. &ddagger; &ast; Patterson Function for Chemical SRO
9.3.4. Short-Range Order Diffuse Intensity
9.3.5. &ddagger; &ast; Isotropic Materials
9.3.6. &ast; Polycrystalline Average and Single Crystal SRO
9.4. &ast; Amorphous Materials
9.4.1. &ddagger; &ast; One-Dimensional Model
9.4.2. &ddagger; &ast; Radial Distribution Function
9.4.3. &ddagger; &ast; Partial Pair Correlation Functions
9.5. Small Angle Scattering
9.5.1. Concept of Small Angle Scattering
9.5.2. &ast; Guinier Approximation (small ¿k)
9.5.3. &ast; Porod Law (large ¿k)
9.5.4. &ddagger; &ast; Density-Density Correlations (all ¿k)
Further Reading
Problems
10. High-Resolution TEM Imaging
10.1. Huygens Principle
10.1.1. Wavelets from Points in a Continuum
10.1.2. Huygens Principle for a Spherical Wavefront - Fresnel Zones
10.1.3. &ddagger; Fresnel Diffraction Near an Edge
10.2. Physical Optics of High-Resolution Imaging
10.2.1. &ddagger; Wavefronts and Fresnel Propagator
10.2.2. &ddagger; Lenses
10.2.3. &ddagger; Materials
10.3. Experimental High-Resolution Imaging
10.3.1. Defocus and Spherical Aberration
10.3.2. &ddagger; Lenses and Specimens
10.3.3. Lens Characteristics
10.4. &ast; Simulations of High-Resolution TEM Images
10.4.1. Principles of Simulations
10.4.2. &ast; Practice of Simulations
10.5. Issues and Examples in High-Resolution TEM Imaging
10.5.1. Images of Nanostructures
10.5.2. Examples of Interfaces
10.5.3. &ast; Effects of Solute Misfit and Scattering Factor Differences on Spot Intensities
10.5.4. &ast; Specimen and Microscope Parameters
10.5.5. &ast; Hints and Tricks for HRTEM
10.6. Z-Contrast Imaging
10.6.1. Characteristics of Z-Contrast Imaging
10.6.2. Comparison of Z-Contrast Imaging with HRTEM Imaging
10.6.3. Z-Contrast Imaging with Atomic Resolution
10.6.4. Developments in Atomic-Resolution Imaging
Further Reading
Problems
11. Dynamical Theory
11.1. Chapter Overview
11.2. &ddagger; &ast; Mathematical Features of High-Energy Electrons in a Periodic Potential
11.2.1. &ddagger; &ast; The Schrödinger Equation
11.2.2. &ddagger; Kinematical and Dynamical Theory
11.2.3. The Crystal as a Phase Grating
11.3. First Approach to Dynamical Theory - Beam Propagation
11.4. &ddagger; Second Approach to Dynamical Theory - Bloch Waves and Dispersion Surfaces
11.4.1. Diffracted Beams, {¿ g }, are Beats of Bloch Waves, {¿ (j) }
11.4.2. Crystal Periodicity and Dispersion Surfaces
11.4.3. Energies of Bloch Waves in a Periodic Potential
11.4.4. &ddagger; General Two-Beam Dynamical Theory
11.5. Essential Difference Between Kinematical and Dynamical Theories
11.6. &ddagger; Diffraction Error, s g , in Two-Beam Dynamical Theory
11.6.1. Bloch Wave Amplitudes and Diffraction Error
11.6.2. Dispersion Surface Construction
11.7. Dynamical Diffraction Contrast from Crystal Defects
11.7.1. Dynamical Diffraction Contrast Without Absorption
11.7.2. &ddagger; &ast; Two-Beam Dynamical Theory of Stacking Fault Contrast
11.7.3. Dynamical Diffraction Contrast with Absorption
11.8. &ddagger; &ast; Multi-Beam Dynamical Theories of Electron Diffraction
Further Reading
Problems
Bibliography
Further Reading
References and Figures
A. Appendix
A.1. Indexed Powder Diffraction Patterns
A.2. Mass Attenuation Coefficients for Characteristic K\overline {{\alpha}} X-Rays
A.3. Atomic Form Factors for X-Rays
A.4. X-Ray Dispersion Corrections for Anomalous Scattering
A.5. Atomic Form Factors for 200 keV Electrons and Procedure for Conversion to Other Voltages
A.6. Indexed Single Crystal Diffraction Patterns: fcc, bcc, dc, hcp
A.7. Stereographic Projections
A.8. Examples of Fourier Transforms
A.9. K¿ 1 , K¿ 2 Splitting and the Rachinger Correction
A.10. Numerical Approximation for the Voigt Function
A.11. Debye-Waller Factor from Wave Amplitude
A.12. Review of Dislocations
A.13. TEM Laboratory Exercises
A.3.1. Preliminary - JEOL 2000FX Daily Operation
A.3.2. Preliminary - Philips 400T Daily Operation
A.3.3. Laboratory 1 - Microscope Procedures and Calibration with Au and MoO 3
A.3.4. Laboratory 2 - Diffraction Analysis of ¿′ Precipitates
A.3.5. Laboratory 3 - Chemical Analysis of ¿′ Precipitates
A.3.6. Laboratory 4 - Contrast Analysis of Defects
A.14. Fundamental and Derived Constants
Index

Transmission electron microscopy and diffractometry of materials /

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