A posteriori error analysis via duality theory : with applications in modeling and numerical approximations /

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Bibliographic Details
Author / Creator:Han, Weimin.
Imprint:New York : Springer Science, c2005.
Description:xvi, 302 p. : ill. ; 25 cm.
Language:English
Series:Advances in mechanics and mathematics ; v. 8
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/5614990
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ISBN:0387235361 (alk. paper)
Notes:Includes bibliographical references (p. [287]-299) and index.

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