Scanning probe microscopy : characterization, nanofabrication and device application of functional materials /
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| Imprint: | Dordrecht ; New York : Kluwer Academic, 2005. |
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| Description: | xxxvii, 488 p. : ill. ; 25 cm. |
| Language: | English |
| Series: | NATO science series. Series II, Mathematics, physics, and chemistry ; v. 186 |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/5648422 |
