DNA damage recognition /

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Bibliographic Details
Imprint:Boca Raton : Taylor & Francis, 2005.
Description:xxii, 845 p. : ill. ; 26 cm.
Language:English
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/5924737
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Other authors / contributors:Siede, Wolfram.
Kow, Yoke Wah.
Doetsch, Paul W.
ISBN:9780824759612 (alk. paper)
0824759613 (alk. paper)
Notes:Includes bibliographical references and index.

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Call Number: QH467 .D154 2005
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