Handbook of practical X-ray fluorescence analysis /

Handbook of practical X-ray fluorescence analysis /

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Bibliographic Details
Imprint:Berlin ; New York : Springer, ©2006.
Description:xix, 863 pages : illustrations (some color) ; 24 cm
Language:English
Subject:
X-ray spectroscopy.
X-ray spectroscopy.
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/6098818
Hidden Bibliographic Details
Other authors / contributors:Beckhoff, B. (Burkhard)
ISBN:9783540286035
3540286039
Notes:Includes bibliographical references (pages 783-833) and index.

MARC

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300 |a xix, 863 pages :  |b illustrations (some color) ;  |c 24 cm 
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504 |a Includes bibliographical references (pages 783-833) and index. 
505 0 0 |g 1.  |t Introduction /  |r T. Arai --  |g 2.  |t X-ray sources --  |t Introduction /  |r N. Langhoff and A. Simionovici --  |t X-ray tubes /  |r V. Arkadiev, W. Knupfer and N. Langhoff --  |t Radioisotope sources /  |r T. Cechak and J. Leonhardt --  |t Synchrotron radiation sources /  |r A. Simionovici and J. Chavanne --  |g 3.  |t X-ray optics --  |t Introduction /  |r A. Erko --  |t Mirror optics /  |r V. Arkadiev and A. Bjeoumikhov --  |t Diffraction optics - elements of diffraction theory /  |r A. Erko --  |t Optics for monochromators /  |r A. Antonov, V. Arkadiev, B. Beckhoff, A. Erko, I. Grigorieva, B. Kanngiesser and B. Vidal --  |t Focusing diffraction optics /  |r A. Erko --  |t Refraction x-ray optics /  |r A. Erko --  |g 4.  |t X-ray detectors and XRF detection channels --  |t Introduction /  |r F. Scholze --  |t X-ray detectors and signal processing /  |r A. Longoni and C. Fiorini --  |t High resolution imaging x-ray CCD spectrometers /  |r L. Struder, N. Meidinger and R. Hartmann --  |t Wavelength dispersive XRF and a comparison with EDS /  |r N. Kawahara and T. Shoji --  |g 5.  |t Quantitative analysis --  |t Overview /  |r M. Mantler --  |t Basic fundamental parameter equations /  |r M. Mantler --  |t The nature of influence coefficients /  |r M. Mantler --  |t The Lachance-Traill algorithm /  |r J. P. Willis and G. R. Lachance --  |t The Claisse-Quintin algorithm /  |r J. P. Willis and G. R. Lachance --  |t The COLA algorithm /  |r J. P. Willis and G. R. Lachance --  |t The de Jongh algorithm /  |r B. A. R. Vrebos --  |t The Broll-Tertian algorithm /  |r K.-E. Mauser --  |t The Japanese industrial standard method /  |r N. Kawahara --  |t The fundamental algorithm /  |r R. M. Rousseau --  |t Compensation methods /  |r B. A. R. Vrebos --  |t Thin and layered samples /  |r P. N. Brouwer --  |t Complex excitation effects and light elements /  |r N. Kawahara --  |t Standardless methods /  |r K.-E. Mauser --  |t Monte Carlo methods /  |r M. Mantler --  |t Errors and reliability issues /  |r M. Mantler --  |t Standardized methods /  |r K.-E. Mauser --  |g 6.  |t Specimen preparation /  |r J. Injuk, R. Van Grieken, A. Blank, L. Eksperiandova and V. Buhrke --  |g 7.  |t Methodological developments and applications --  |t Micro x-ray fluorescence spectroscopy /  |r B. Kanngiesser and M. Haschke --  |t Micro-XRF with synchrotron radiation /  |r A. Simionovici and P. Chevallier --  |t Total-reflection x-ray fluorescence (TXRF) wafer analysis /  |r C. Streli, P. Wobrauschek, L. Fabry, S. Pahlke, F. Comin, R. Barrett, P. Pianetta, K. Luning and B. Beckhoff --  |t Analysis of layers /  |r V. Rossiger and B. Nensel --  |t Environmental studies /  |r S. Kurunczi, J. Osan, S. Torok and M. Betti --  |t Geology, mining, metallurgy /  |r D. Rammlmair, M. Wilke, K. Rickers, R. A. Schwarzer, A. Moller and A. Wittenberg --  |t Application in arts and archaeology /  |r O. Hahn, I. Reiche and H. Stege --  |t XRF-application in numismatics /  |r J. Engelhardt --  |t Analysis for forensic investigations /  |r J. Zieba-Palus --  |t X-ray fluorescence analysis in the life sciences /  |r G. Weseloh, S. Staub and J. Feuerborn --  |t Non-invasive identification of chemical compounds by EDXRS /  |r P. Hoffmann --  |g 8.  |t Appendix --  |t X-ray safety and protection /  |r P. Ambrosi --  |t Useful data sources and links /  |r R. Wedell and W. Malzer. 
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