Reliability and risk : a Bayesian perspective /

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Bibliographic Details
Author / Creator:Singpurwalla, Nozer D.
Imprint:Chichester, West Sussex, England ; New York : J. Wiley & Sons, c2006.
Description:xiv, 371 p. : ill. ; 26 cm.
Language:English
Series:Wiley series in probability and statistics
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/6120292
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ISBN:9780470855027 (alk. paper)
0470855029 (alk. paper)
Notes:Includes bibliographical references (p. [349]-363) and index.
Table of Contents:
  • 1. Introduction and overview
  • 2. The quantification of uncertainty
  • 3. Exchangeability and indifference
  • 4. Stochastic models of failure
  • 5. Parametric failure data analysis
  • 6. Composite reliability : signatures
  • 7. Survival in dynamic environments
  • 8. Point processes for event histories
  • 9. Non-parametric Bayes methods in reliability
  • 10. Survivability of co-operative, competing and vague systems
  • 11. Reliability and survival in econometrics and finance
  • App. A. Markov chain Monte Carlo simulation
  • App. B. Fourier series models and the power spectrum
  • App. C. Network survivability and Borel's paradox.