Experimental techniques for low-temperature measurements : cryostat design, material properties, and superconductor critical-current testing /

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Bibliographic Details
Author / Creator:Ekin, J. W.
Imprint:Oxford [England] ; New York : Oxford University Press, 2006.
Description:xxviii, 673 p. : ill. ; 26 cm.
Language:English
Subject:
Format: E-Resource Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/6167380
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ISBN:0198570546 (alk. paper)
9780198570547 (alk. paper)
Notes:Includes bibliographical references and index.
Table of Contents:
  • Part I. Cryostat Design and Materials Selection
  • 1. Introduction to Measurement Cryostats and Cooling Methods
  • 2. Heat Transfer at Cryogenic Temperatures
  • 3. Cryostat Construction
  • 4. Wiring and Connections
  • 5. Temperature Measurement and Control
  • 6. Properties of Solids at Low Temperatures
  • Part II. Electrical Transport Measurements: Sample Holders and Contacts
  • 7. Sample Holders
  • 8. Sample Contacts
  • Part III. Superconductor Critical-Current Measurements and Data Analysis
  • 9. Critical-Current Measurements
  • 10. Critical-Current Data Analysis
  • Appendixes