Relationship of recombination lifetime and dark current in silicon p-n junctions /

Relationship of recombination lifetime and dark current in silicon p-n junctions /

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Bibliographic Details
Imprint:	Golden, Colo. : National Renewable Energy Laboratory, [2005]
Description:	1 volume : digital, PDF file.
Language:	English
Series:	NREL/CP ; 520-37438 Conference paper (National Renewable Energy Laboratory (U.S.)) ; 520-37438.
Subject:	Photovoltaic cells -- Testing. Silicon solar cells -- Testing.
Format:	E-Resource U.S. Federal Government Document Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/6559493

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Other authors / contributors:	Ahrenkiel, Richard K. National Renewable Energy Laboratory (U.S.)
Notes:	Title from title screen (viewed on Feb. 2, 2006). "February 2005." Mode of access: Internet from the NREL web site. Address as of 2/2/06: http://www.nrel.gov/docs/fy05osti/37438.pdf; current access available via PURL.
GPO item no.:	0430-P-04 (online)
Govt.docs classification:	E 9.17:NREL/CP-520-37438

Description
Item Description:	Title from title screen (viewed on Feb. 2, 2006). "February 2005."
Physical Description:	1 volume : digital, PDF file.
Format:	Mode of access: Internet from the NREL web site. Address as of 2/2/06: http://www.nrel.gov/docs/fy05osti/37438.pdf; current access available via PURL.