Focused ion beam systems : basics and applications /

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Bibliographic Details
Imprint:Cambridge, UK ; New York : Cambridge University Press, 2007.
Description:xi, 395 p. : ill. ; 26 cm.
Language:English
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/6643838
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Other authors / contributors:Yao, Nan.
ISBN:9780521831994 (hbk.)
0521831997 (hbk.)
Notes:Includes bibliographical references and index.

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