Microscopy, techniques and capabilities : September 21-22, 1982, London, England /

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Bibliographic Details
Imprint:Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c1983.
Description:vi, 130 p. : ill. ; 28 cm.
Language:English
Series:Proceedings / SPIE ; v. 368
Proceedings of SPIE--the International Society for Optical Engineering v. 368.
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/711682
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Other authors / contributors:Baker, L. R. (Lionel R.)
Sira Limited
Institute of Physics (Great Britain)
Institution of Electrical Engineers
ISBN:0892524030 (pbk.)
Notes:Includes bibliographical references and indexes.
committed to retain 20170930 20421213 HathiTrust

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