Synthesis and metrology of nanoscale oxides and thin films : March 24-28, 2008, San Francisco, California, USA.

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Bibliographic Details
Imprint:Warrendale, PA : Materials Research Society, c2008.
Description:240 p. : ill. ; 24 cm.
Language:English
Series:Materials Research Society symposium proceedings ; v. 1074
Materials Research Society symposia proceedings ; v. 1074.
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/7734512
Hidden Bibliographic Details
Other authors / contributors:Materials Research Society. Meeting (2008 : San Francisco, Calif.)
ISBN:1605608556
9781605608556
Notes:"Spring 2008."--Cover.
"Printed from e-media with permission by: Curran Associates."
Includes bibliographical references and index.

MARC

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